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Diarios / Fernando Pessoa ; traducción de Juan José Álvarez Galán
by Pessoa, Fernando, (1888-1935) | Álvarez Galán, Juan José, (1981-), traductor. Material type:  Printed books Publisher: Madrid : Gadir, D.L. 2008Items
| Location |
Call no. |
Status |
Vol info |
Loan type |
| Colección General (Campus Alcobendas) |
PQ9261 .P417 A6 2008 |
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VLSI-SoC: Design for Reliability, Security, and Low Power : 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers / edited by Youngsoo Shin, Chi Ying Tsui, Jae-Joon Kim, Kiyoung Choi, Ricardo Reis
by SpringerLink (Online service) | Shin, Youngsoo, editor literario | Tsui, Chi Ying, editor literario | Kim, Jae-Joon, editor literario | Choi, Kiyoung, editor literario | Reis, Ricardo, editor literario. Material type:  E-book Publisher: Cham : Springer International Publishing, 2016Items
| Location |
Call no. |
Status |
Vol info |
Loan type |
| Acceso Electrónico (UEM) |
QA76.9.C643 V575 2016 EB |
reference |
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Electromigration inside logic cells : modeling, analyzing and mitigating signal electromigration in NanoCMOS / Gracieli Posser, Sachin S. Sapatnekar, Ricardo Reis.
by Posser, Gracieli, autor | Reis, Ricardo, autor | Sapatnekar, Sachin S, (1967-), autor. Material type: E-book Publisher: Cham, Switzerland : Springer, 2017Items
| Location |
Call no. |
Status |
Vol info |
Loan type |
| Acceso Electrónico (UEM) |
TK7868.L6 P677 2017 EB |
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Circuit Design for Reliability / edited by Ricardo Reis, Yu Cao, Gilson Wirth.
by Reis, Ricardo, editor literario | Cao, Yu, editor literario | Wirth, Gilson, editor literario. Material type: E-book Publisher: New York, NY : Springer International Publishing, 2015Items
| Location |
Call no. |
Status |
Vol info |
Loan type |
| Acceso Electrónico (UEM) |
TK7874 2015 EB |
reference |
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VLSI-SoC : Design Trends : 28th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2020, Salt Lake City, UT, USA, October 6-9, 2020, Revised and Extended Selected Papers / edited by Andrea Calimera, Pierre-Emmanuel Gaillardon, Kunal Korgaonkar, Shahar Kvatinsky, Ricardo Reis
by Calimera, Andrea, editor literario | Gaillardon, Pierre-Emmanuel, editor literario | Korgaonkar, Kunal, editor literario | Kvatinsky, Shahar, editor literario | Reis, Ricardo, editor literario. Edition: First edition 2021Material type: E-book Publisher: Cham : Springer International Publising, 2021Items
| Location |
Call no. |
Status |
Vol info |
Loan type |
| Acceso Electrónico (UEM) |
TK7874.75 2021 EB |
reference |
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Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs / by Alexandra Zimpeck, Cristina Meinhardt, Laurent Artola, Ricardo Reis
by Zimpeck, Alexandra, autor | Meinhardt, Cristina, autor | Artola, Laurent, autor | Reis, Ricardo, autor. Edition: First edition 2021Material type: E-book Publisher: Cham : Springer International Publishing, 2021Items
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Call no. |
Status |
Vol info |
Loan type |
| Acceso Electrónico (UEM) |
TK7871.95 2021 EB |
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Ortónimos, 1902-1913 / Fernando Pessoa ; edición bilingüe de Juan Barja ; prólogo de Miguel Casado
by Pessoa, Fernando, (1888-1935), autor | Pessoa, Fernando, (1888-1935). Poesía | Barja, Juan, (1951-), traductor, editor literario. Material type: Printed books Publisher: Madrid : Abada Editores, 2018Copyright date: ©2018Items
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Call no. |
Status |
Vol info |
Loan type |
| Colección General (Campus Villaviciosa) |
PQ9261 .P417 A6 2018 |
available |
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VLSI-SoC: Technology Advancement on SoC Design 29th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2021, Singapore, October 4-8, 2021, Revised and Extended Selected Papers / edited by Victor Grimblatt, Chip Hong Chang, Ricardo Reis, Anupam Chattopadhyay, Andrea Calimera
by Grimblatt, Victor, editor literario | Chang, Chip Hong, editor literario | Reis, Ricardo, editor literario | Chattopadhyay, Anupam, editor literario | Calimera, Andrea, editor literario. Edition: 1st edition 2022 Publisher: Cham : Springer International Publishing, 2022Items
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Call no. |
Status |
Vol info |
Loan type |
| Acceso Electrónico (UEM) |
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