VLSI-SoC: Design for Reliability, Security, and Low Power : 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers / edited by Youngsoo Shin, Chi Ying Tsui, Jae-Joon Kim, Kiyoung Choi, Ricardo Reis
Contributor(s): SpringerLink (Online service)
| Shin, Youngsoo., editor literario | Tsui, Chi Ying., editor literario | Kim, Jae-Joon, editor literario | Choi, Kiyoung, editor literario | Reis, Ricardo, editor literario
Material type: 
E-bookSeries: (IFIP Advances in Information and Communication Technology, 1868-4238; 483).Publisher: Cham : Springer International Publishing, 2016Description: 1 recurso en línea (XIII, 223 páginas) : 121 ilustraciones.ISBN: 9783319460970.Subject: Ordenadores | Estructuras de datos (Informática)DDC classification: 004.6 Online resources: Acceso a este recurso digital (usuarios Universidad Europea de Madrid)
Abstract: This book contains extended and revised versions of the best papers presented at the 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, held in Daejeon, Korea, in October 2015. The 10 papers included in the book were carefully reviewed and selected from the 44 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about new challenges both at the physical and system-design levels, as well as in the test of these systems.
| Item type | Current library | Collection | Call number | Copy number | Status | Date due | Barcode | Item holds | |
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LIBRO-E NO PRÉSTAMO
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Madrid Digital Acceso Electrónico (UEM) | Ciencias e Ingeniería | QA76.9.C643 V575 2016 EB (Browse shelf(Opens below)) | .i1159830x | Acceso electrónico | eBOOK .i1159830x |
This book contains extended and revised versions of the best papers presented at the 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, held in Daejeon, Korea, in October 2015. The 10 papers included in the book were carefully reviewed and selected from the 44 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about new challenges both at the physical and system-design levels, as well as in the test of these systems.
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