Biblioteca CRAI Dulce Chacón - Universidad Europea de Madrid

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VLSI-SoC: Design for Reliability, Security, and Low Power : 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers / edited by Youngsoo Shin, Chi Ying Tsui, Jae-Joon Kim, Kiyoung Choi, Ricardo Reis

by SpringerLink (Online service) | Shin, Youngsoo, editor literario | Tsui, Chi Ying, editor literario | Kim, Jae-Joon, editor literario | Choi, Kiyoung, editor literario | Reis, Ricardo, editor literario.

Material type: bookE-book Publisher: Cham : Springer International Publishing, 2016
Online access: Acceso a este recurso digital (usuarios Universidad Europea de Madrid)Digital Resources
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Location Call no. Status Vol info Loan type
Acceso Electrónico (UEM) QA76.9.C643 V575 2016 EB reference

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Electromigration inside logic cells : modeling, analyzing and mitigating signal electromigration in NanoCMOS / Gracieli Posser, Sachin S. Sapatnekar, Ricardo Reis.

by Posser, Gracieli, autor | Reis, Ricardo, autor | Sapatnekar, Sachin S, (1967-), autor.

Material type: bookE-book Publisher: Cham, Switzerland : Springer, 2017
Online access: Acceso a este recurso digital (usuarios Universidad Europea de Madrid)Digital Resources
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Acceso Electrónico (UEM) TK7868.L6 P677 2017 EB reference

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Circuit Design for Reliability / edited by Ricardo Reis, Yu Cao, Gilson Wirth.

by Reis, Ricardo, editor literario | Cao, Yu, editor literario | Wirth, Gilson, editor literario.

Material type: bookE-book Publisher: New York, NY : Springer International Publishing, 2015
Online access: Acceso a este recurso digital (usuarios Universidad Europea de Madrid)Digital Resources
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Acceso Electrónico (UEM) TK7874 2015 EB reference

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Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs / by Alexandra Zimpeck, Cristina Meinhardt, Laurent Artola, Ricardo Reis

by Zimpeck, Alexandra, autor | Meinhardt, Cristina, autor | Artola, Laurent, autor | Reis, Ricardo, autor.

Edition: First edition 2021Material type: bookE-book Publisher: Cham : Springer International Publishing, 2021
Online access: Acceso a este recurso digital (usuarios Universidad Europea de Madrid)Digital Resources
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Acceso Electrónico (UEM) TK7871.95 2021 EB reference

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