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Structural, Syntactic, and Statistical Pattern Recognition : Joint IAPR International Workshops, S+SSPR 2020, Padua, Italy, January 21-22, 2021, Proceedings / edited by Andrea Torsello, Luca Rossi, Marcello Pelillo, Battista Biggio, Antonio Robles-Kelly

Contributor(s): Torsello, Andrea, editor literario | Rossi, Luca, editor literario | Pelillo, Marcello, editor literario | Biggio, Battista, editor literario | Robles-Kelly, Antonio, editor literario | SpringerLink
Material type: materialTypeLabelE-bookSeries: (Image Processing Computer Vision Pattern Recognition and Graphics ; 12644).Publisher: Cham, Switzerland : Springer International Publising, 2021Edition: First edition 2021.Description: 1 recurso en línea (XII, 378 páginas) : 103 ilustraciones, 84 ilustraciones a color.ISBN: 9783030739737.Subject: Reconocimiento de formas -- Congresos y asambleas | Patentes -- Congresos y asambleasOnline resources: Acceso a este recurso digital (usuarios Universidad Europea de Madrid)Digital Resources
Contents:
Classification and data processing -- Deep learning -- Graph-theoretic methods -- Multimedia analysis and understanding.
Abstract: This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2020, held in Padua, Italy, in January 2021. The 35 papers presented in this volume were carefully reviewed and selected from 81 submissions. The accepted papers cover the major topics of current interest in pattern recognition, including classification and clustering, deep learning, structural matching and graph-theoretic methods, and multimedia analysis and understanding.
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Item type Current library Collection Call number Status Date due Barcode Item holds
LIBRO-E NO PRÉSTAMO LIBRO-E NO PRÉSTAMO Madrid Digital Acceso Electrónico (UEM) Ciencias e Ingeniería TK7882.P3 2021 EB (Browse shelf(Opens below)) Acceso electrónico eBook.26042204
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Classification and data processing -- Deep learning -- Graph-theoretic methods -- Multimedia analysis and understanding.

This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2020, held in Padua, Italy, in January 2021. The 35 papers presented in this volume were carefully reviewed and selected from 81 submissions. The accepted papers cover the major topics of current interest in pattern recognition, including classification and clustering, deep learning, structural matching and graph-theoretic methods, and multimedia analysis and understanding.

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