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Structural, Syntactic, and Statistical Pattern Recognition : Joint IAPR International Workshops, S+SSPR 2020, Padua, Italy, January 21-22, 2021, Proceedings edited by Andrea Torsello, Luca Rossi, Marcello Pelillo, Battista Biggio, Antonio Robles-Kelly - First edition 2021 - 1 recurso en línea (XII, 378 páginas) 103 ilustraciones, 84 ilustraciones a color - Image Processing Computer Vision Pattern Recognition and Graphics 12644 .

Classification and data processing -- Deep learning -- Graph-theoretic methods -- Multimedia analysis and understanding.

This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2020, held in Padua, Italy, in January 2021. The 35 papers presented in this volume were carefully reviewed and selected from 81 submissions. The accepted papers cover the major topics of current interest in pattern recognition, including classification and clustering, deep learning, structural matching and graph-theoretic methods, and multimedia analysis and understanding.

ISBN: 9783030739737

Standard No.: 10.1007/978-3-030-73973-7 doi

Subjects--Topical Terms:
Reconocimiento de formas--Congresos y asambleas
Patentes--Congresos y asambleas

LC Class. No.: TK7882.P3 / 2021 EB