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Hip Magnetic Resonance Imaging / edited by Young-Jo Kim, Tallal Charles Mamisch.

by Kim, Young-Jo, editor literario | Mamisch, Tallal Charles, editor literario.

Material type: bookE-book Publisher: New York : Springer International Publishing, 2014Items
Location Call no. Status Vol info Loan type
Acceso Electrónico (UEM) RD772 .H576 2014 EB reference

Congenital vascular malformations : a comprehensive review of current management / Young-Wook Kim, Byung-Boong Lee, Wayne F. Yakes, Young-Soo Do, editors.

by Do, Young-Soo, editor literario | Kim, Young-Wook, editor literario | Lee, Byung-Boong, editor literario | Yakes, Wayne F, editor literario.

Material type: bookE-book Publisher: Berlin, Germany : Springer International Publishing, 2017Items
Location Call no. Status Vol info Loan type
Acceso Electrónico (UEM) RC691 2017 EB reference

Structural Dynamics : Theory and Computation / by Mario Paz, Young Hoon Kim

by SpringerLink (Online service) | Paz, Mario, autor | Kim, Young Hoon, (1976-), autor.

Edition: Sixth editionMaterial type: bookE-book Publisher: Cham : Springer International Publishing : Imprint: Springer, 2019Items
Location Call no. Status Vol info Loan type
Acceso Electrónico (UEM) TA654 2019 EB reference

Coefficient Diagram Method for Control System Design / by Shunji Manabe, Young Chol Kim

by Manabe, Shunji, (1945-), autor | Kim, Young Chol, autor.

Edition: First edition 2021Material type: bookE-book Publisher: Singapore : Springer International Publishing, 2021Items
Location Call no. Status Vol info Loan type
Acceso Electrónico (UEM) TJ223.P76 2021 EB reference

The Massachusetts General Hospital Clinical Approach to Vascular Ultrasound : Protocols and Procedures / edited by Anahita Dua, Drena Root, Scott Manchester, Young Kim

by Dua, Anahita, editor literario | Root, Drena, editor literario | Manchester, Scott, editor literario | Kim, Young, editor literario.

Edition: First edition 2022Source: Springer Nature eBookMaterial type: bookE-book Publisher: Cham : Springer International Publishing, 2022Items
Location Call no. Status Vol info Loan type
Acceso Electrónico (UEM) RC691.6.U47 2022 EB reference

HF-Based High-K Dielectrics : Process Development, Performance Characterization, and Reliability / by Young-Hee Kim, Jack C. Lee

by Kim, Young-Hee, (1972-), autor | Lee, Jack C, autor.

Edition: 1st edition 2005Material type: bookE-book Publisher: Cham : Springer International Publishing, 2005Items
Location Call no. Status Vol info Loan type
Acceso Electrónico (UEM) QC585 2005 EB reference

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