Biblioteca CRAI Dulce Chacón - Universidad Europea de Madrid

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Soft Error Mechanisms, Modeling and Mitigation / by Selahattin Sayil

by Sayil, Selahattin | SpringerLink (Online service).

Edition: 1st ed.Material type: bookE-book Publisher: Cham : Springer International Publishing, 2016
Online access: Acceso a este recurso digital (usuarios Universidad Europea de Madrid)Digital Resources
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Location Call no. Status Vol info Loan type
Acceso Electrónico (UEM) TK5102.96 .S29 2016 EB reference

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Contactless VLSI Measurement and Testing Techniques / by Selahattin Sayil.

by Sayil, Selahattin, autor..

Publisher: Cham : Springer International Publishing, 2018
Online access: Acceso a este recurso digital (usuarios Universidad Europea de Madrid)Digital Resources
Items
Location Call no. Status Vol info Loan type
Acceso Electrónico (UEM) TK7874.75 S295 2018 EB reference

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Noise Contamination in Nanoscale VLSI Circuits / by Selahattin Sayil

by Sayil, Selahattin, autor.

Edition: 1st edition 2022Material type: bookE-book Publisher: Cham : Springer International Publishing, 2022
Online access: Acceso a este recurso digital (usuarios Universidad Europea de Madrid)Digital Resources
Items
Location Call no. Status Vol info Loan type
Acceso Electrónico (UEM) TK7874.75 2022 EB reference

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