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Noise Contamination in Nanoscale VLSI Circuits / by Selahattin Sayil

By: Sayil, Selahattin, autor
Material type: materialTypeLabelE-bookSeries: (Synthesis Lectures on Digital Circuits & Systems, 1932-3174).Publisher: Cham : Springer International Publishing, 2022Edition: 1st edition 2022.Description: 1 recurso en línea (XI, 136 páginas) : 95 ilustraciones, 42 ilustraciones en blanco y negro.ISBN: 9783031127519.Subject: Circuitos integrados VLSI | Contaminación acústica | MicroelectrónicaOnline resources: Acceso a este recurso digital (usuarios Universidad Europea de Madrid)Digital Resources
Contents:
Introduction -- Interconnect Noise -- Clock Noise and Uncertainty -- Power Supply Noise -- Substrate Coupling Noise -- Radiation Induced Soft Error Mechanisms -- Thermally Induced Errors -- Impact of Process Variations.
Summary: This textbook provides readers with a comprehensive introduction to various noise sources that significantly reduce performance and reliability in nanometer-scale integrated circuits. The author covers different types of noise, such as crosstalk noise caused by signal switching of adjacent wires, power supply noise or IR voltage drop in the power line due to simultaneous buffer / gate switching events, substrate coupling noise, radiation-induced transients, thermally induced noise and noise due to process and environmental Coverages also includes the relationship between some of these noise sources, as well as compound effects, and modeling and mitigation of noise mechanisms.
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Holdings
Item type Current library Collection Call number Status Date due Barcode Item holds
LIBRO-E NO PRÉSTAMO LIBRO-E NO PRÉSTAMO Madrid Digital Acceso Electrónico (UEM) Ciencias e Ingeniería TK7874.75 2022 EB (Browse shelf(Opens below)) Acceso electrónico eBook.01112107
Total holds: 0

Introduction -- Interconnect Noise -- Clock Noise and Uncertainty -- Power Supply Noise -- Substrate Coupling Noise -- Radiation Induced Soft Error Mechanisms -- Thermally Induced Errors -- Impact of Process Variations.

This textbook provides readers with a comprehensive introduction to various noise sources that significantly reduce performance and reliability in nanometer-scale integrated circuits. The author covers different types of noise, such as crosstalk noise caused by signal switching of adjacent wires, power supply noise or IR voltage drop in the power line due to simultaneous buffer / gate switching events, substrate coupling noise, radiation-induced transients, thermally induced noise and noise due to process and environmental Coverages also includes the relationship between some of these noise sources, as well as compound effects, and modeling and mitigation of noise mechanisms.

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