Noise Contamination in Nanoscale VLSI Circuits
Sayil, Selahattin
Noise Contamination in Nanoscale VLSI Circuits by Selahattin Sayil - 1st edition 2022 - 1 recurso en línea (XI, 136 páginas) 95 ilustraciones, 42 ilustraciones en blanco y negro - Synthesis Lectures on Digital Circuits & Systems 1932-3174 .
Introduction -- Interconnect Noise -- Clock Noise and Uncertainty -- Power Supply Noise -- Substrate Coupling Noise -- Radiation Induced Soft Error Mechanisms -- Thermally Induced Errors -- Impact of Process Variations.
This textbook provides readers with a comprehensive introduction to various noise sources that significantly reduce performance and reliability in nanometer-scale integrated circuits. The author covers different types of noise, such as crosstalk noise caused by signal switching of adjacent wires, power supply noise or IR voltage drop in the power line due to simultaneous buffer / gate switching events, substrate coupling noise, radiation-induced transients, thermally induced noise and noise due to process and environmental Coverages also includes the relationship between some of these noise sources, as well as compound effects, and modeling and mitigation of noise mechanisms.
9783031127519
10.1007/978-3-031-12751-9 doi
Circuitos integrados VLSI
Contaminación acústica
Microelectrónica
TK7874.75 / 2022 EB
Noise Contamination in Nanoscale VLSI Circuits by Selahattin Sayil - 1st edition 2022 - 1 recurso en línea (XI, 136 páginas) 95 ilustraciones, 42 ilustraciones en blanco y negro - Synthesis Lectures on Digital Circuits & Systems 1932-3174 .
Introduction -- Interconnect Noise -- Clock Noise and Uncertainty -- Power Supply Noise -- Substrate Coupling Noise -- Radiation Induced Soft Error Mechanisms -- Thermally Induced Errors -- Impact of Process Variations.
This textbook provides readers with a comprehensive introduction to various noise sources that significantly reduce performance and reliability in nanometer-scale integrated circuits. The author covers different types of noise, such as crosstalk noise caused by signal switching of adjacent wires, power supply noise or IR voltage drop in the power line due to simultaneous buffer / gate switching events, substrate coupling noise, radiation-induced transients, thermally induced noise and noise due to process and environmental Coverages also includes the relationship between some of these noise sources, as well as compound effects, and modeling and mitigation of noise mechanisms.
9783031127519
10.1007/978-3-031-12751-9 doi
Circuitos integrados VLSI
Contaminación acústica
Microelectrónica
TK7874.75 / 2022 EB