000 04586cam a2200445Ii 4500
001 94627
003 ES-MaUEC
005 20230102112624.0
006 m o d
007 cr cnu---unuuu
008 160927s2016 sz ob 001 0 eng d
020 _a3319447726
_q(electronic bk.)
020 _a9783319447728
_q(electronic bk.)
020 _z3319447718
020 _z9783319447711
035 _a(OCoLC)959278161
_z(OCoLC)959330647
_z(OCoLC)959591768
_z(OCoLC)962058989
_z(OCoLC)962324429
_z(OCoLC)974649987
040 _aN$T
_cN$T
_dYDX
_dIDEBK
_dN$T
_dEBLCP
_dGW5XE
_dOCLCF
_dIDB
_dUAB
_dIOG
_dESU
_dZ5A
_dJBG
_dIAD
_dICW
_dICN
_dOTZ
_dAZU
_dCOO
_dMERUC
_dUPM
_dOCLCO
_dOCLCQ
_dU3W
_dES-MaUEC
_bspa
050 4 _aTA347.V4
_bS563 2016 EB
100 1 _aShoaib, Nosherwan,
_eautor
245 1 0 _aVector network analyzer (VNA) measurements and uncertainty assessment
_cNosherwan Shoaib.
264 1 _aCham, Switzerland
_bSpringer
_c[2017]
264 4 _c2017
300 _a1 recurso en línea
336 _aTexto
_btxt
_2rdacontent
337 _aelectrónico
_bc
_2rdamedia
338 _arecurso electrónico
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
490 0 _aPoliTO Springer series
_x2509-6796
500 _aSpringerLink
_bSpringer Engineering eBooks 2017 English+International
504 _aIncluye referencias bibliográficas e índice
505 0 _aPreface; Acknowledgments; Contents; 1 General Introduction; 1.1 Introduction; 1.2 VNA Architecture; 1.3 VNA Measurements; 1.3.1 Measurement Errors; 1.3.2 Calibration Standards; 1.3.3 Error Box Model; 1.3.4 Calibration Techniques; 1.4 Measurement Uncertainty; 1.4.1 Uncertainty Components Classification; 1.4.2 Representation of S-Parameter Uncertainty; References; 2 Waveguide Measurement Uncertainty; 2.1 Introduction; 2.2 Mathematical Model and Measurement Uncertainty Evaluation; 2.3 Measurands and Measurement Setup; 2.4 Dimensional Measurements; 2.5 Measurement Results; 2.6 Uncertainty Budget
505 8 _a2.7 Discussion2.8 Conclusion; References; 3 VNA Calibration Comparison; 3.1 Introduction; 3.2 Calibration Techniques; 3.3 Measurement Uncertainty Evaluation; 3.4 Measurands and Measurement Setup; 3.5 Dimensional Characterization; 3.6 Measurement Results; 3.7 Uncertainty Budget; 3.8 Discussion; 3.9 Conclusion; References; 4 VNA Connection Repeatability Investigation; 4.1 Introduction; 4.2 Mathematical Formulation; 4.3 Experimental Setup; 4.4 Measurement Results; 4.4.1 Flush Short-Circuit Measurements; 4.4.2 Offset Short-Circuit Measurements; 4.4.3 Near-Matched Termination Measurements
505 8 _a4.4.4 Mismatched Termination Measurements4.5 Discussions; 4.6 Conclusion; References; 5 VNA Verification Artefacts; 5.1 Introduction; 5.2 Dimensional Tolerances and Flange Misalignment; 5.3 Electromagnetic Simulations; 5.3.1 Electromagnetic Simulations for Waveguide Artefacts; 5.3.2 Electromagnetic Simulations for Coaxial Artefact; 5.4 Uncertainty Estimation; 5.5 Experimental Setup; 5.6 Results and Discussions; 5.6.1 Waveguide Verification Standards; 5.6.2 Coaxial Verification Standard; 5.7 Conclusion; References; Appendix General Conclusions; Index
520 3 _aThis book describes vector network analyzer measurements and uncertainty assessments, particularly in waveguide test-set environments, in order to establish their compatibility to the International System of Units (SI) for accurate and reliable characterization of communication networks. It proposes a fully analytical approach to measurement uncertainty evaluation, while also highlighting the interaction and the linear propagation of different uncertainty sources to compute the final uncertainties associated with the measurements. The book subsequently discusses the dimensional characterization of waveguide standards and the quality of the vector network analyzer (VNA) calibration techniques. The book concludes with an in-depth description of the novel verification artefacts used to assess the performance of the VNAs. It offers a comprehensive reference guide for beginners to experts, in both academia and industry, whose work involves the field of network analysis, instrumentation and measurements.
650 7 _aIngeniería
_xModelos matemáticos
_2embne
_0(OCoLC)fst00844249
_0
_9667394
710 2 _aPolitecnico di Torino.
856 4 0 _uhttps://go.openathens.net/redirector/universidadeuropea.es?url=http://link.springer.com/10.1007/978-3-319-44772-8
_zAcceso a este recurso digital (usuarios Universidad Europea de Madrid)
988 _aEBOOK, asignarmaterias, EBSPRINGER_2017A
998 _b02/2018
_dz
_e-
_zSI
999 _c94627
_d94627
_x1