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007			cr nn 008mamaa
008			160413s2016 si | s |||| 0|eng d
020			_a9789811008849
040			_aES-MaUEC
050		4	_aTK7874.78 _bY836 2016 EB
082	0	4	_a621.3815
100	1		_aYuan, Jiann-Shiun. _9100874 _0Local
245	1	0	_aCMOS RF Circuit Design for Reliability and Variability _cby Jiann-Shiun Yuan
260			_aSingapore _bSpringer _c2016
300			_a1 recurso en línea (VI, 106 p.) 101 il.
336			_aTexto (visual) _btxt _2rdacontent
337			_aelectrónico _bc _2rdamedia
338			_arecurso electrónico _bcr _2rdacarrier
338			_aonline resource _bcr _2rdacarrier
490	1		_aSpringerBriefs in Applied Sciences and Technology _x2191-530X
505	0		_aCMOS Transistor Reliability and Variability -- Wireless Receiver and Transmitter Circuit Reliability -- Low Noise Amplifier Reliability and Variability -- Power Amplifier Reliability and Variability -- Voltage Controlled Oscillator Reliability and Variability -- Mixer Reliability.
520			_aThe subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typical reliability issues in the device and technology level and then to examine their impact on RF wireless transceiver circuit performance. Analytical equations, experimental data, device and circuit simulation results will be given for clear explanation. The main benefit the reader derive from this book will be clear understanding on how device reliability issues affects the RF circuit performance subjected to operation aging and process variations.
942			_2lcc _cLE
988	0	0	_aEBOOK, EBSPRINGER
650		7	_9139610 _aCircuitos electrónicos _0comprobar BNE19900974538 _2embne
650		7	_aMicroondas _0comprobar BNE19900963345 _2embne _9138714
650	0	7	_aIngeniería _vCongresos y asambleas _0LocalX _2embne _9670301
830		0	_aSpringerBriefs in Applied Sciences and Technology _x2191-530X _9134085
856	4	0	_uhttps://go.openathens.net/redirector/universidadeuropea.es?url=https://link.springer.com/book/10.1007/978-981-10-0884-9 _zAcceso a este recurso digital (usuarios Universidad Europea de Madrid)
901			_ai9789811008849
907			_a.b1296122x _b10-10-17 _c21-11-16
998			_am _a_alco _a_vill _b - - _cm _dz _e- _feng _gsi _h0
945			_aTK7874.78 Y836 2016 EB _g1 _ieBOOK _j0 _lmae _o- _pEUR0.00 _q- _r- _sb _t15 _u0 _v0 _w0 _x0 _y.i11602041 _z06-04-17
999			_c86844 _d86844 _x1