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020 _a9783662488232
040 _aES-MaUEC
050 4 _aTK7836
_b.Z436 2016
082 0 4 _a620.1
100 1 _aZhang, Qingke.
_9100246
_0Local
245 1 0 _aInvestigations on Microstructure and Mechanical Properties of the Cu/Pb-free Solder Joint Interfaces
_cby Qingke Zhang
250 _a1st ed.
260 _aBerlin, Heidelberg
_bSpringer Berlin Heidelberg
_c2016
300 _a1 recurso en línea (XV, 143 páginas)
_b115 ilustraciones, 81 ilustraciones en color
336 _aTexto
_btxt
_2rdacontent
337 _aelectrónico
_bc
_2rdamedia
338 _arecurso electrónico
_bcr
_2rdacarrier
490 0 _aSpringer Theses, Recognizing Outstanding Ph.D. Research
_x2190-5053
505 0 _aResearch Progress in Pb-free Soldering -- Fracture Behavior of IMCs at Cu/Pb-free Solder Interface -- Tensile-compress Fatigue Behavior of Solder Joints -- Shear Creep-fatigue Behavior of Cu/Pb-free Solder Joints -- Thermal Fatigue Behavior of Sn-Ag/Cu Solder Joints -- Conclusions.
520 3 _aThis thesis presents a series of mechanical test methods and comprehensively investigates the deformation and damage behavior of Cu/Pb-free solder joints under different loading conditions. The fracture behavior of Pb-free joint interfaces induced by stress, deformation of solder and substrate are shown, the shear fracture strength of the Cu6Sn5 IMC is measured experimentally for the first time, and the dynamic damage process and microstructure evolution behavior of Pb-free solder joints are revealed intuitively. The thesis puts forward the argument that the local cumulative damage is the major cause of failure in solder joints. The research results provide the experimental and theoretical basis for improving the reliability of solder joints.
710 2 _aSpringerLink (Online service)
_0Local
_9106996
942 _2lcc
_cLE
988 _aEBOOK, asignarmaterias , EBSPRINGER
650 7 _9138325
_aMecánica
_0comprobar BNE19900958451
_2embne
650 0 7 _aAnálisis estructural (Ingeniería)
_0
_2embne
_9150495
856 4 0 _uhttps://go.openathens.net/redirector/universidadeuropea.es?url=https://link.springer.com/book/10.1007/978-3-662-48823-2
_zAcceso a este recurso digital (usuarios Universidad Europea de Madrid)
901 _ai9783662488232
907 _a.b12957756
_b10-10-17
_c21-11-16
998 _am
_a_alco
_a_vill
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945 _aTK7836 .Z436 2016 EB
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_z06-04-17
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