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_aVLSI-SoC: Design for Reliability, Security, and Low Power : _b23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers _cedited by Youngsoo Shin, Chi Ying Tsui, Jae-Joon Kim, Kiyoung Choi, Ricardo Reis |
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_aCham _bSpringer International Publishing _c2016 |
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_a1 recurso en línea (XIII, 223 páginas) _b121 ilustraciones |
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_aIFIP Advances in Information and Communication Technology _x1868-4238 _v483 |
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| 520 | 3 | _aThis book contains extended and revised versions of the best papers presented at the 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, held in Daejeon, Korea, in October 2015. The 10 papers included in the book were carefully reviewed and selected from the 44 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about new challenges both at the physical and system-design levels, as well as in the test of these systems. | |
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_aShin, Youngsoo. _eeditor literario _9100022 _0Local |
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_aTsui, Chi Ying. _eeditor literario _9100023 _0Local |
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_aKim, Jae-Joon _eeditor literario _0Local _9100024 |
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_aChoi, Kiyoung _eeditor literario _0Local _9100025 |
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_aReis, Ricardo _eeditor literario _0Local _9100026 |
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