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020 _a9783319460970
040 _aES-MaUEC
050 4 _aQA76.9.C643
_bV575 2016
082 0 4 _a004.6
245 1 0 _aVLSI-SoC: Design for Reliability, Security, and Low Power :
_b23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers
_cedited by Youngsoo Shin, Chi Ying Tsui, Jae-Joon Kim, Kiyoung Choi, Ricardo Reis
260 _aCham
_bSpringer International Publishing
_c2016
300 _a1 recurso en línea (XIII, 223 páginas)
_b121 ilustraciones
336 _aTexto
_btxt
_2rdacontent
337 _aelectrónico
_bc
_2rdamedia
338 _arecurso electrónico
_bcr
_2rdacarrier
490 0 _aIFIP Advances in Information and Communication Technology
_x1868-4238
_v483
520 3 _aThis book contains extended and revised versions of the best papers presented at the 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, held in Daejeon, Korea, in October 2015. The 10 papers included in the book were carefully reviewed and selected from the 44 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about new challenges both at the physical and system-design levels, as well as in the test of these systems.
710 2 _aSpringerLink (Online service)
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988 _aEBOOK, asignarmaterias , EBSPRINGER
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700 1 _aShin, Youngsoo.
_eeditor literario
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700 1 _aTsui, Chi Ying.
_eeditor literario
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700 1 _aKim, Jae-Joon
_eeditor literario
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700 1 _aChoi, Kiyoung
_eeditor literario
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700 1 _aReis, Ricardo
_eeditor literario
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856 4 0 _uhttps://go.openathens.net/redirector/universidadeuropea.es?url=https://link.springer.com/book/10.1007/978-3-319-46097-0
_zAcceso a este recurso digital (usuarios Universidad Europea de Madrid)
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_b10-10-17
_c21-11-16
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