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020 _a9783319220352
040 _aES-MaUEC
050 4 _aTK7874.75
_bM643 2016
082 0 4 _a621.3815
100 1 _997289
_aMohamed, Khaled Salah
_0Local
245 1 0 _aIP Cores Design from Specifications to Production :
_bModeling, Verification, Optimization, and Protection
_cby Khaled Salah Mohamed
260 _aCham
_bSpringer International Publishing
_c2016
300 _a1 recurso en línea (IX, 154 páginas)
_b153 ilustraciones, 115 ilustraciones en color
336 _aTexto
_btxt
_2rdacontent
337 _aelectrónico
_bc
_2rdamedia
338 _arecurso electrónico
_bcr
_2rdacarrier
490 0 _aAnalog Circuits and Signal Processing
_x1872-082X
505 0 _a1. Introduction -- 2. IP Cores Design from Specifications to Production: Modeling, Verification, Optimization, and Protection -- 3. Analyzing the Trade-off between Different Memory Cores and Controllers -- 4. SOC BUSES AND PERIPHERALS: FEATURES AND ARCHITECTURES -- 5. Verilog for Implementation and Verification -- 6. New Trends in SoC Verification: UVM, Bug Localization, Scan-Chain-Based Methodology, GA-Based Test Generation -- 7. Conclusions.
520 3 _aThis book describes the life cycle process of IP cores, from specification to production, including IP modeling, verification, optimization, and protection. Various trade-offs in the design process are discussed, including� those associated with many of the most common memory cores, controller IPs� and system-on-chip (SoC) buses. Readers will also benefit from the author�s practical coverage of new verification methodologies. such as bug localization, UVM, and scan-chain.� A SoC case study is presented to compare traditional verification with the new verification methodologies. ·�������� Discusses the entire life cycle process of IP cores, from specification to production, including IP modeling, verification, optimization, and protection; ·�������� Introduce a deep introduction for Verilog for both implementation and verification point of view.� ·�������� Demonstrates how to use IP in applications such as memory controllers and SoC buses. ·�������� Describes a new verification methodology called bug localization; ·�������� Presents a novel scan-chain methodology for RTL debugging; ·�������� Enables readers to employ UVM methodology in straightforward, practical terms.
650 7 _aMicroprocesadores
_9141164
_0comprobar BNE19900994978
_2embne
650 7 _aElectrónica
_0comprobar BNE19900963053
_2embne
_9138690
856 4 0 _uhttps://go.openathens.net/redirector/universidadeuropea.es?url=https://link.springer.com/book/10.1007/978-3-319-22035-2
_zAcceso a este recurso digital (usuarios Universidad Europea de Madrid)
901 _ai9783319220352
907 _a.b12940872
_b10-10-17
_c21-11-16
942 _2lcc
_cLE
945 _aTK7874.75 M643 2016 EB
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988 _aEBOOK, asignarmaterias , EBSPRINGER
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