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007			cr nn 008mamaa
008			151111s2016 gw | s |||| 0|eng d
020			_a9783319011745
040			_aES-MaUEC
050		4	_aTK7868.P7 _bP375 2016
100	1		_aParker, Kenneth P. _996745 _0Local
245	1	4	_aThe Boundary-Scan Handbook _cby Kenneth P Parker
250			_a4th ed.
260			_aCham _bSpringer International Publishing _c2016
300			_a1 recurso en línea (XXXIV, 552 páginas) _b215 ilustraciones
336			_aTexto _btxt _2rdacontent
337			_aelectrónico _bc _2rdamedia
338			_arecurso electrónico _bcr _2rdacarrier
505	0		_aBoundary-Scan Basics And Vocabulary.-� Boundary-Scan Description Language (BSDL) -- Boundary-Scan Testing -- Advanced Boundary-Scan Topics -- Design for Boundary-Scan Test -- Analog Measurement Basics -- IEEE 1149.4 Analog Boundary-Scan.-� IEEE 1149.6 Testing Advanced I/O.-� IEEE 1532:In-System Configuration -- IEEE 1149.8.1: Passive Components -- IEEE 1149.1:The 2013 Revision.-� IEEE 1149.6: The 2015 Revision.
520	3		_aAimed at electronics industry professionals, this 4th edition of the Boundary Scan�Handbook describes recent changes to the IEEE1149.1 Standard Test Access Port and�Boundary-Scan Architecture. This updated edition features new chapters on the possible�effects of the changes on the work of the practicing test engineers and the new�1149.8.1 standard. Anyone needing to understand the basics of boundary scan and its�practical industrial implementation will need this book. Provides an overview of the recent changes to the 1149.1 standard and the effect�of the changes on the work of test engineers; � Explains the new IEEE 1149.8.1 subsidiary standard and applications; � Describes the latest updates on the supplementary IEEE testing standards. In particular, addresses: IEEE Std 1149.1 � � � � � � � � � � �Digital Boundary-Scan IEEE Std 1149.4 � � � � � � � � � � �Analog Boundary-Scan IEEE Std 1149.6 � � � � � � � � � ���Advanced I/O Testing IEEE Std 1149.8.1 � � � � � � � � � �Passive Component Testing IEEE Std 1149.1-2013 � � � � � � � � The 2013 Revision of 1149.1 IEEE Std 1532 � � � � � � � � � � � �In-System Configuration IEEE Std 1149.6-2015 � � � � � � � � The 2015 Revision of 1149.6.
710	2		_aSpringerLink (Online service) _0Local _9106996
942			_2lcc _cLE
988			_aEBOOK, asignarmaterias , EBSPRINGER,
650		7	_aMicroprocesadores _9141164 _0comprobar BNE19900994978 _2embne
650	0	7	_aSemiconductores _0 _2embne _9140004
856	4	0	_uhttps://go.openathens.net/redirector/universidadeuropea.es?url=https://link.springer.com/book/10.1007/978-3-319-01174-5 _zAcceso a este recurso digital (usuarios Universidad Europea de Madrid)
901			_ai9783319011745
907			_a.b12937897 _b10-10-17 _c21-11-16
998			_am _a_alco _a_vill _b - - _cm _dz _e- _feng _ggw _h4
945			_aTK7868.P7 P375 2016 EB _g1 _ieBOOK _j0 _lmae _o- _pEUR0.00 _q- _r- _sb _t15 _u0 _v0 _w0 _x0 _y.i11582546 _z06-04-17
999			_c84511 _d84511 _x1