000			02721nam a2200337 i 4500
999			_c401626 _d401626
001			401626
003			ES-MaUEC
005			20240523151846.0
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007			cr nn 008mamaa
008			230918s2024 sz | fo |||| 0|eng d
020			_a9783031407185
024	7		_a10.1007/978-3-031-40718-5 _2doi
040			_aES-MaUEC _bspa _cES-MaUEC _dES-MaUEC
050		4	_aTJ1313 _b2024 EB
245	0	0	_aAdvanced Information-Measuring Technologies and Systems I _cedited by Volodymyr Eremenko, Artur Zaporozhets
250			_a1st ed. 2024
264		1	_aCham _bSpringer International Publishing _c2024
300			_a1 recurso en línea
336			_atexto _btxt _2rdacontent
337			_aelectrónico _bc _2rdamedia
338			_arecurso electrónico _bcr _2rdacarrier
490	0		_aStudies in Systems, Decision and Control _x2198-4190 _v439
505	0		_aPreface -- Contents -- Metrological Support of Measurement Channels with Bridge Circuits -- Application of Exponential Splines in the Measurement and Control of Electric Circuit Parameters -- Improving of Methods of Impedance Parameters Units Reproduction and Measurement Accuracy Increasing for Ensuring Metrological Traceability -- Implementation of Information and Measurement Systems at the Base Specialized Internet Protocols -- Model of Information Signals Formation in the Diagnostics of Composite Products -- Theory and Practice of Ensuring the Validity in Testing Laboratories -- Methodology for Controlling Greenhouse Microclimate Parameters and Yield Forecast Using Neural Network Technologies.
520			_aThe book presents the main scientific directions and issues of research conducted in the Department of Information and Measurement Technologies at the National Technical University of Ukraine "Ihor Sikorskyi Kyiv Polytechnic Institute". The presented results cover almost all scientific directions related to information and measurement technologies-metrological support of measurement channels of information and measurement systems, methods of reproducing units of electric circuit parameters, development of specialized information and measurement systems, mathematical methods of processing measurement information, models of formation of information signals and fields, statistical diagnostic methods, information support of testing, and calibration laboratories.
988			_aSpringer_Engineering_2024
650		7	_2embne _9168886 _aMedición _xAparatos e instrumentos
856	4	0	_uhttps://go.openathens.net/redirector/universidadeuropea.es?url=https://doi.org/10.1007/978-3-031-40718-5 _zAcceso a este recurso digital (usuarios Universidad Europea de Madrid)
942			_2lcc _cLE
998			_b05/2024 _dz _eb _zSI