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| 001 | 395868 | ||
| 003 | ES-MaUEC | ||
| 005 | 20230126231343.0 | ||
| 006 | a||||fo|||| 00| 0 | ||
| 007 | cr nn 008mamaa | ||
| 008 | 230126s2022 sz | s |||| 0|eng d | ||
| 020 | _a9783030777302 | ||
| 024 | 7 |
_a10.1007/978-3-030-77730-2 _2doi |
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| 040 |
_aES-MaUEC _bspa _cES-MaUEC _dES-MaUEC |
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| 050 | 4 |
_aTK7871.95 _b2022 EB |
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| 100 | 1 |
_aKhandelwal, Sourabh _eautor _4aut _4http://id.loc.gov/vocabulary/relators/aut _9686268 |
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| 245 | 1 | 0 |
_aAdvanced SPICE Model for GaN HEMTs (ASM-HEMT) : _bA New Industry-Standard Compact Model for GaN-based Power and RF Circuit Design _cby Sourabh Khandelwal |
| 250 | _a1st edition 2022 | ||
| 264 | 1 |
_aCham _bSpringer International Publishing _c2022 |
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| 300 |
_a1 recurso en línea (XV, 188 páginas) _b162 ilustraciones, 138 ilustraciones a color |
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| 336 |
_atexto _btxt _2rdacontent |
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| 337 |
_aelectrónico _bc _2rdamedia |
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| 338 |
_arecurso electrónico _bcr _2rdacarrier |
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| 347 |
_aarchivo de texto _bPDF |
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| 505 | 0 | _aIntroduction -- GaN Device Operation -- Introduction to device modeling -- Industry standard ASM-HEMT compact model - Introduction -- Core charge and current model in ASM-HEMT model -- Real device effects model in ASM-HEMT model -- Radio-frequency GaN modeling with ASM-HEMT model -- Power GaN device modeling with ASM-HEMT model -- Model quality testing -- Design-Technology Co-optimization with ASM-HEMT model. | |
| 520 | _aThis book discusses in detail the Advanced SPICE Model for GaN HEMTs (ASM-HEMT), a new industry standard model for GaN-based power and RF circuit design. The author describes this new, standard model in detail, covering the different components of the ASM GaN model from fundamental derivations to the implementation in circuit simulation tools. The book also includes a detailed description of parameter extraction steps and model quality tests, which are critically important for effective use of this standard model in circuit simulation and product design. Coverage includes both radio-frequency (RF), and power electronics applications of this model. Practical issues related to measurement data and parameter extraction flow are also discussed, enabling readers easily to adopt this new model for design flow and simulation tools. Describes in detail a new industry standard for GaN-based power and RF circuit design; Includes discussion of practical problems and their solutions in GaN device modeling; Covers both radio-frequency (RF) and power electronics application of GaN technology; Describes modeling of both GaN RF and power devices. | ||
| 988 | _aSpringer_Engineering_2022 | ||
| 650 | 7 |
_2embne _9162208 _aTransistores de efecto de campo |
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| 650 | 7 |
_2embne _9140004 _aSemiconductores |
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| 650 | 7 |
_2embne _9139614 _aCircuitos integrados |
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| 776 | 0 | 8 |
_iPrinted edition: _z9783030777296 |
| 776 | 0 | 8 |
_iPrinted edition: _z9783030777319 |
| 776 | 0 | 8 |
_iPrinted edition: _z9783030777326 |
| 856 | 4 | 0 |
_uhttps://go.openathens.net/redirector/universidadeuropea.es?url=https://doi-org.ezproxy.universidadeuropea.es/10.1007/978-3-030-77730-2 _zAcceso a este recurso digital (usuarios Universidad Europea de Madrid) |
| 942 |
_2lcc _cLE |
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| 998 |
_b01/2023 _dz _eIG _zSI |
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