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008			230116s2022 gw | s |||| 0|eng d
020			_a9783658359263
024	7		_a10.1007/978-3-658-35926-3 _2doi
040			_aES-MaUEC _bspa _cES-MaUEC _dES-MaUEC
050		4	_aQC411 _b2022 EB
100	1		_aTaudt, Christopher _eautor _4aut _4http://id.loc.gov/vocabulary/relators/aut _9686003
245	1	0	_aDevelopment and Characterization of a Dispersion-Encoded Method for Low-Coherence Interferometry _cby Christopher Taudt
250			_a1st edition 2022
264		1	_aWiesbaden _bSpringer International Publishing _c2022
300			_a1 recurso en línea (XXIII, 163 páginas) _b65 ilustraciones a color
336			_atexto _btxt _2rdacontent
337			_aelectrónico _bc _2rdamedia
338			_arecurso electrónico _bcr _2rdacarrier
347			_aarchivo de texto _bPDF
505	0		_a1 Introduction and motivation -- 2 Related works and basic considerations -- 3 Surface profilometry -- 4 Polymer characterization -- 5 Thin-film characterization -- 6 Conclusion.
506	0		_aOpen Access
520			_aThis Open Access book discusses an extension to low-coherence interferometry by dispersion-encoding. The approach is theoretically designed and implemented for applications such as surface profilometry, polymeric cross-linking estimation and the determination of thin-film layer thicknesses. During a characterization, it was shown that an axial measurement range of 79.91 µm with an axial resolution of 0.1 nm is achievable. Simultaneously, profiles of up to 1.5 mm in length were obtained in a scan-free manner. This marked a significant improvement in relation to the state-of-the-art in terms of dynamic range. Also, the axial and lateral measurement range were decoupled partially while functional parameters such as surface roughness were estimated. The characterization of the degree of polymeric cross-linking was performed as a function of the refractive index. It was acquired in a spatially-resolved manner with a resolution of 3.36 x 10-5. This was achieved by the development of a novel mathematical analysis approach. About the Author Christopher Taudt holds a diploma degree in Mechanical Engineering of the WH Zwickau. During a stay at the IT Sligo, Ireland, he earned a Bachelor Degree in Mechanical Engineering. After his studies, Christopher Taudt has worked on research projects in optical metrology and earned a PhD in optical metrology from the TU Dresden.
988			_aSpringer_Engineering_2022
650		7	_2embne _9686004 _aInterferometría
650		7	_2embne _9142021 _aComunicaciones ópticas
776	0	8	_iPrinted edition: _z9783658359256
776	0	8	_iPrinted edition: _z9783658359270
856	4	0	_uhttps://go.openathens.net/redirector/universidadeuropea.es?url=https://doi.org/10.1007/978-3-658-35926-3 _zAcceso a este recurso digital (usuarios Universidad Europea de Madrid)
942			_2lcc _cLE
998			_b01/2023 _dz _eIG _zSI