000			03894nam a2200409 i 4500
999			_c387974 _d387974
001			387974
003			ES-MaUEC
005			20230505112311.0
006			a||||fo|||| 00| 0
007			cr nn 008mamaa
008			220601s2009 sz | o |||| 0|eng d
020			_a9783031797910
024	7		_a10.1007/978-3-031-79791-0 _2doi
040			_aES-MaUEC _bspa _cES-MaUEC _dES-MaUEC
050		4	_aTK7874 _b2009 EB
100	1		_aMarshall, Andrew _d1958- _eautor _4aut _4http://id.loc.gov/vocabulary/relators/aut _9688385
245	1	0	_aMismatch and Noise in Modern IC Processes _cby Andrew Marshall
250			_a1st edition 2009
264		1	_aCham _bSpringer International Publishing _c2009
300			_a1 recurso en línea (X, 139 páginas)
336			_aTexto _btxt _2rdacontent
337			_aelectrónico _bc _2rdamedia
338			_arecurso electrónico _bcr _2rdacarrier
347			_aarchivo de texto _bPDF
490	0		_aSynthesis Lectures on Digital Circuits & Systems _x1932-3174
505	0		_aPart I: Mismatch -- Introduction -- Variability and Mismatch in Digital Systems -- Variability and Mismatch in Analog Systems I -- Variability and Mismatch in Analog Systems II -- Lifetime-Induced Variability -- Mismatch in Nonconventional Processes -- Mismatch Correction Circuits -- Part II: Noise -- Component and Digital Circuit Noise -- Noise Effects in Digital Systems -- Noise Effects in Analog Systems -- Circuit Design to Minimize Noise Effects -- Noise Considerations in SOI.
520			_aComponent variability, mismatch, and various noise effects are major contributors to design limitations in most modern IC processes. Mismatch and Noise in Modern IC Processes examines these related effects and how they affect the building block circuits of modern integrated circuits, from the perspective of a circuit designer. Variability usually refers to a large scale variation that can occur on a wafer to wafer and lot to lot basis, and over long distances on a wafer. This phenomenon is well understood and the effects of variability are included in most integrated circuit design with the use of corner or statistical component models. Mismatch, which is the emphasis of section I of the book, is a local level of variability that leaves the characteristics of adjacent transistors unmatched. This is of particular concern in certain analog and memory systems, but also has an effect on digital logic schemes, where uncertainty is introduced into delay times, which can reduce margins and introduce 'race' conditions. Noise is a dynamic effect that causes a local mismatch or variability that can vary during operation of a circuit, and is considered in section II. Noise can be the result of atomic effects in devices or circuit interactions, and both of these are discussed in terms of analog and digital circuitry. Table of Contents: Part I: Mismatch / Introduction / Variability and Mismatch in Digital Systems / Variability and Mismatch in Analog Systems I / Variability and Mismatch in Analog Systems II / Lifetime-Induced Variability / Mismatch in Nonconventional Processes / Mismatch Correction Circuits / Part II: Noise / Component and Digital Circuit Noise / Noise Effects in Digital Systems / Noise Effects in Analog Systems / Circuit Design to Minimize Noise Effects / Noise Considerations in SOI.
988			_aSynthesis Collection of Technology_2009
650		7	_2embne _9138689 _aMicroelectrónica
650		7	_2embne _9139614 _aCircuitos integrados
776	0	8	_iPrinted edition: _z9783031797903
776	0	8	_iPrinted edition: _z9783031797927
856	4	0	_uhttps://go.openathens.net/redirector/universidadeuropea.es?url=https://doi.org/10.1007/978-3-031-79791-0 _zAcceso a este recurso digital (usuarios Universidad Europea de Madrid)
942			_2lcc _cLE
998			_b05/2023 _dz _eb _zSI