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008			230422s2013 sz | s |||| 0|eng d
020			_a9783031017391
024	7		_a10.1007/978-3-031-01739-1 _2doi
040			_aES-MaUEC _bspa _cES-MaUEC _dES-MaUEC
050		4	_aTK7895.M5 _b2013 EB
100	1		_aJanapa Reddi, Vijay _eautor _4aut _4http://id.loc.gov/vocabulary/relators/aut _9688223
245	1	0	_aResilient Architecture Design for Voltage Variation _cby Vijay Janapa Reddi, Meeta Sharma Gupta
250			_a1st edition 2013
264		1	_aCham _bSpringer International Publishing _c2013
300			_a1 recurso en línea (XVI, 124 páginas)
336			_atexto _btxt _2rdacontent
337			_aelectrónico _bc _2rdamedia
338			_arecurso electrónico _bcr _2rdacarrier
347			_aarchivo de texto _bPDF
490	0		_aSynthesis Lectures on Computer Architecture _x1935-3243
505	0		_aIntroduction -- Modeling Voltage Variation -- Understanding the Characteristics of Voltage Variation -- Traditional Solutions and Emerging Solution Forecast -- Allowing and Tolerating Voltage Emergencies -- Predicting and Avoiding Voltage Emergencies -- Eliminiating Recurring Voltage Emergencies -- Future Directions on Resiliency.
520			_aShrinking feature size and diminishing supply voltage are making circuits sensitive to supply voltage fluctuations within the microprocessor, caused by normal workload activity changes. If left unattended, voltage fluctuations can lead to timing violations or even transistor lifetime issues that degrade processor robustness. Mechanisms that learn to tolerate, avoid, and eliminate voltage fluctuations based on program and microarchitectural events can help steer the processor clear of danger, thus enabling tighter voltage margins that improve performance or lower power consumption. We describe the problem of voltage variation and the factors that influence this variation during processor design and operation. We also describe a variety of runtime hardware and software mitigation techniques that either tolerate, avoid, and/or eliminate voltage violations. We hope processor architects will find the information useful since tolerance, avoidance, and elimination are generalizable constructs that can serve as a basis for addressing other reliability challenges as well. Table of Contents: Introduction / Modeling Voltage Variation / Understanding the Characteristics of Voltage Variation / Traditional Solutions and Emerging Solution Forecast / Allowing and Tolerating Voltage Emergencies / Predicting and Avoiding Voltage Emergencies / Eliminiating Recurring Voltage Emergencies / Future Directions on Resiliency.
988			_aSynthesis Collection of Technology_2013
650		7	_2embne _9141164 _aMicroprocesadores
700	1		_aGupta, Meeta Sharma _eautor _4aut _4http://id.loc.gov/vocabulary/relators/aut _9688224
776	0	8	_iPrinted edition: _z9783031006111
776	0	8	_iPrinted edition: _z9783031028670
856	4	0	_uhttps://go.openathens.net/redirector/universidadeuropea.es?url=https://doi.org/10.1007/978-3-031-01739-1 _zAcceso a este recurso digital (usuarios Universidad Europea de Madrid)
942			_2lcc _cLE
998			_b04/2023 _dz _eIG _zSI