| 000 | 03091nam a22004335i 4500 | ||
|---|---|---|---|
| 999 |
_c387587 _d387587 |
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| 001 | 387587 | ||
| 003 | ES-MaUEC | ||
| 005 | 20230326133437.0 | ||
| 006 | a||||fo|||| 00| 0 | ||
| 007 | cr nn 008mamaa | ||
| 008 | 220601s2008 sz | s |||| 0|eng d | ||
| 020 | _a9783031025532 | ||
| 024 | 7 |
_a10.1007/978-3-031-02553-2 _2doi |
|
| 040 |
_aES-MaUEC _bspa _cES-MaUEC _dES-MaUEC |
||
| 050 | 4 |
_aTA1660 _b2008 EB |
|
| 100 | 1 |
_aChen, Ray T. _eautor _4aut _4http://id.loc.gov/vocabulary/relators/aut _9687652 |
|
| 245 | 1 | 0 |
_aOptical Interconnects _cby Ray T. Chen, Chulchae Choi |
| 250 | _a1st edition 2008 | ||
| 264 | 1 |
_aCham _bSpringer International Publishing _c2008 |
|
| 300 | _a1 recurso en línea (XI, 91 páginas) | ||
| 336 |
_atexto _btxt _2rdacontent |
||
| 337 |
_aelectrónico _bc _2rdamedia |
||
| 338 |
_arecurso electrónico _bcr _2rdacarrier |
||
| 347 |
_aarchivo de texto _bPDF |
||
| 490 | 0 |
_aSynthesis Lectures on Solid State Materials and Devices _x1932-1724 |
|
| 505 | 0 | _aIntroduction -- Thinned Vertical Cavity Surface Emitting Laser Fabrication -- VCSEL Characterization -- Thermal Management of Embedded VCSEL -- Optical Interconnection Layer -- System Integration -- Summary -- Effects of Thermal-Via Structures on Thin Film VCSELs for a Fully Embedded Board-Level Optical Interconnection System. | |
| 520 | _aThis book describes fully embedded board level optical interconnect in detail including the fabrication of the thin-film VCSEL array, its characterization, thermal management, the fabrication of optical interconnection layer, and the integration of devices on a flexible waveguide film. All the optical components are buried within electrical PCB layers in a fully embedded board level optical interconnect. Therefore, we can save foot prints on the top real estate of the PCB and relieve packaging difficulty reduced by separating fabrication processes. To realize fully embedded board level optical interconnects, many stumbling blocks need to be addressed such as thin-film transmitter and detector, thermal management, process compatibility, reliability, cost effective fabrication process, and easy integration. The material presented eventually will relieve such concerns and make the integration of optical interconnection highly feasible. The hybrid integration of the optical interconnection layer and electrical layers is ongoing. | ||
| 988 | _aSynthesis Collection of Technology_2008 | ||
| 650 | 7 |
_2embne _9138689 _aMicroelectrónica |
|
| 650 | 7 |
_2embne _9139613 _aCircuitos impresos |
|
| 650 | 7 |
_2embne _9139614 _aCircuitos integrados |
|
| 700 | 1 |
_aChoi, Chulchae _eautor _4aut _4http://id.loc.gov/vocabulary/relators/aut _9687653 |
|
| 776 | 0 | 8 |
_iPrinted edition: _z9783031014253 |
| 776 | 0 | 8 |
_iPrinted edition: _z9783031036811 |
| 856 | 4 | 0 |
_uhttps://go.openathens.net/redirector/universidadeuropea.es?url=https://doi.org/10.1007/978-3-031-02553-2 _zAcceso a este recurso digital (usuarios Universidad Europea de Madrid) |
| 942 |
_2lcc _cLE |
||
| 998 |
_b03/2023 _dz _esc _zSI |
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