| 000 | 03115nam a22004215i 4500 | ||
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| 999 |
_c387327 _d387327 |
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| 001 | 387327 | ||
| 003 | ES-MaUEC | ||
| 005 | 20230313201504.0 | ||
| 006 | a||||fo|||| 00| 0 | ||
| 007 | cr nn 008mamaa | ||
| 008 | 220601s2017 sz | s |||| 0|eng d | ||
| 020 | _a9783031020339 | ||
| 024 | 7 |
_a10.1007/978-3-031-02033-9 _2doi |
|
| 040 |
_aES-MaUEC _bspa _cES-MaUEC _dES-MaUEC |
||
| 050 | 4 |
_aTK8315 _b2017 EB |
|
| 100 | 1 |
_aArai, Yasuo _eautor _4aut _4http://id.loc.gov/vocabulary/relators/aut _9687309 |
|
| 245 | 1 | 0 |
_aRadiation Imaging Detectors Using SOI Technology _cby Yasuo Arai, Ikuo Kurachi |
| 250 | _a1st edition 2017 | ||
| 264 | 1 |
_aCham _bSpringer International Publishing _c2017 |
|
| 300 | _a1 recurso en línea (XI, 59 páginas) | ||
| 336 |
_atexto _btxt _2rdacontent |
||
| 337 |
_aelectrónico _bc _2rdamedia |
||
| 338 |
_arecurso electrónico _bcr _2rdacarrier |
||
| 347 |
_aarchivo de texto _bPDF |
||
| 490 | 0 |
_aSynthesis Lectures on Emerging Engineering Technologies _x2381-1439 |
|
| 505 | 0 | _aPreface -- Acknowledgments -- Introduction -- Major Issues in SOI Pixel Detector -- Basic SOI Pixel Process -- Radiation Hardness Improvements -- Advanced Process Developments -- Detector Research and Developments -- Summary -- Bibliography -- Authors' Biographies. | |
| 520 | _aSilicon-on-Insulator (SOI) technology is widely used in high-performance and low-power semiconductor devices. The SOI wafers have two layers of active silicon (Si), and normally the bottom Si layer is a mere physical structure. The idea of making intelligent pixel detectors by using the bottom Si layer as sensors for X-ray, infrared light, high-energy particles, neutrons, etc. emerged from very early days of the SOI technology. However, there have been several difficult issues with fabricating such detectors and they have not become very popular until recently. This book offers a comprehensive overview of the basic concepts and research issues of SOI radiation image detectors. It introduces basic issues to implement the SOI detector and presents how to solve these issues. It also reveals fundamental techniques, improvement of radiation tolerance, applications, and examples of the detectors. Since the SOI detector has both a thick sensing region and CMOS transistors in a monolithic die, many ideas have emerged to utilize this technology. This book is a good introduction for people who want to develop or use SOI detectors. | ||
| 988 | _aSynthesis Collection of Technology_2017 | ||
| 650 | 7 |
_2embne _9144216 _aSilicio |
|
| 650 | 7 |
_2embne _9670116 _aSistemas de imágenes _xDiseño y construcción |
|
| 700 | 1 |
_aKurachi, Ikuo _eautor _4aut _4http://id.loc.gov/vocabulary/relators/aut _9687307 |
|
| 776 | 0 | 8 |
_iPrinted edition: _z9783031009051 |
| 776 | 0 | 8 |
_iPrinted edition: _z9783031031618 |
| 856 | 4 | 0 |
_uhttps://go.openathens.net/redirector/universidadeuropea.es?url=https://doi.org/10.1007/978-3-031-02033-9 _zAcceso a este recurso digital (usuarios Universidad Europea de Madrid) |
| 942 |
_2lcc _cLE |
||
| 998 |
_b03/2023 _dz _esc _zSI |
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