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008			220831s2022 sz | s |||| 0|eng d
020			_a9783031127519
024	7		_a10.1007/978-3-031-12751-9 _2doi
040			_aES-MaUEC _bspa _cES-MaUEC _dES-MaUEC
050		4	_aTK7874.75 _b2022 EB
100			_aSayil, Selahattin _eautor _4aut _4http://id.loc.gov/vocabulary/relators/aut _998922
245	1	0	_aNoise Contamination in Nanoscale VLSI Circuits _cby Selahattin Sayil
250			_a1st edition 2022
264		1	_aCham _bSpringer International Publishing _c2022
300			_a1 recurso en línea (XI, 136 páginas) _b95 ilustraciones, 42 ilustraciones en blanco y negro
336			_atexto _btxt _2rdacontent
337			_aelectrónico _bc _2rdamedia
338			_arecurso electrónico _bcr _2rdacarrier
347			_aarchivo de texto _bPDF
490	0		_aSynthesis Lectures on Digital Circuits & Systems _x1932-3174
505	0		_aIntroduction -- Interconnect Noise -- Clock Noise and Uncertainty -- Power Supply Noise -- Substrate Coupling Noise -- Radiation Induced Soft Error Mechanisms -- Thermally Induced Errors -- Impact of Process Variations.
520			_aThis textbook provides readers with a comprehensive introduction to various noise sources that significantly reduce performance and reliability in nanometer-scale integrated circuits. The author covers different types of noise, such as crosstalk noise caused by signal switching of adjacent wires, power supply noise or IR voltage drop in the power line due to simultaneous buffer / gate switching events, substrate coupling noise, radiation-induced transients, thermally induced noise and noise due to process and environmental Coverages also includes the relationship between some of these noise sources, as well as compound effects, and modeling and mitigation of noise mechanisms.
988			_aSynthesis Collection of Technology_2022
650		7	_2embne _9670141 _aCircuitos integrados VLSI
650		7	_2embne _9686584 _aContaminación acústica
650		7	_2embne _9138689 _aMicroelectrónica
776	0	8	_iPrinted edition: _z9783031127502
776	0	8	_iPrinted edition: _z9783031127526
776	0	8	_iPrinted edition: _z9783031127533
856	4	0	_uhttps://go.openathens.net/redirector/universidadeuropea.es?url=https://doi.org/10.1007/978-3-031-12751-9 _zAcceso a este recurso digital (usuarios Universidad Europea de Madrid)
942			_2lcc _cLE
998			_b02/2023 _dz _esc _zSI