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_aStructural, Syntactic, and Statistical Pattern Recognition : _bJoint IAPR International Workshops, S+SSPR 2020, Padua, Italy, January 21-22, 2021, Proceedings _cedited by Andrea Torsello, Luca Rossi, Marcello Pelillo, Battista Biggio, Antonio Robles-Kelly |
| 250 | _aFirst edition 2021 | ||
| 264 | 1 |
_aCham, Switzerland _bSpringer International Publising _c2021 |
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_a1 recurso en línea (XII, 378 páginas) _b103 ilustraciones, 84 ilustraciones a color |
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_aImage Processing Computer Vision Pattern Recognition and Graphics _v12644 |
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| 505 | 0 | _aClassification and data processing -- Deep learning -- Graph-theoretic methods -- Multimedia analysis and understanding. | |
| 520 | 3 | _aThis book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2020, held in Padua, Italy, in January 2021. The 35 papers presented in this volume were carefully reviewed and selected from 81 submissions. The accepted papers cover the major topics of current interest in pattern recognition, including classification and clustering, deep learning, structural matching and graph-theoretic methods, and multimedia analysis and understanding. | |
| 988 | _aSpringer_Computer_2021 | ||
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_2embne _aReconocimiento de formas _vCongresos y asambleas _9152614 |
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_2embne _9138135 _aPatentes _vCongresos y asambleas |
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_aTorsello, Andrea _eeditor literario _4edt _4http://id.loc.gov/vocabulary/relators/edt |
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_aRossi, Luca _eeditor literario _4edt _4http://id.loc.gov/vocabulary/relators/edt |
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_aPelillo, Marcello _eeditor literario _0(orcid)0000-0001-8992-9243 _1https://orcid.org/0000-0001-8992-9243 _4edt _4http://id.loc.gov/vocabulary/relators/edt |
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_aBiggio, Battista _eeditor literario _4edt _4http://id.loc.gov/vocabulary/relators/edt |
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_aRobles-Kelly, Antonio _eeditor literario _4edt _4http://id.loc.gov/vocabulary/relators/edt |
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_iPrinted edition: _z9783030739744 |
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_uhttps://go.openathens.net/redirector/universidadeuropea.es?url=https://doi.org/10.1007/978-3-030-73973-7 _zAcceso a este recurso digital (usuarios Universidad Europea de Madrid) |
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