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020			_a9783030687908
024	7		_a10.1007/978-3-030-68790-8 _2doi
040			_aES-MaUEC _bspa _cES-MaUEC _dES-MaUEC
050		4	_aTA1634 _b2021 EB
245	0	0	_aPattern Recognition : _bICPR International Workshops and Challenges, virtual event, January 10-15, 2021, proceedings. Part II _cedited by Alberto Del Bimbo, Rita Cucchiara, Stan Sclaroff, Giovanni Maria Farinella, Tao Mei, Marco Bertini, Hugo Jair Escalante, Roberto Vezzani
250			_aFirst edition 2021
264		1	_aCham, Switzerland _bSpringer International Publising _c2021
300			_a1 recurso en línea (XX, 753 páginas) _b286 ilustraciones, 257 ilustraciones a color
336			_2rdacontent _aTexto _btxt
337			_2rdamedia _aelectrónico _bc
338			_2rdacarrier _arecurso electrónico _bcr
347			_atext file _bPDF _2rda
490	0		_aImage Processing Computer Vision Pattern Recognition and Graphics ; _v12662
520	3		_aThis 8-volumes set constitutes the refereed of the 25th International Conference on Pattern Recognition Workshops, ICPR 2020, held virtually in Milan, Italy and rescheduled to January 10 - 11, 2021 due to Covid-19 pandemic. The 416 full papers presented in these 8 volumes were carefully reviewed and selected from about 700 submissions. The 46 workshops cover a wide range of areas including machine learning, pattern analysis, healthcare, human behavior, environment, surveillance, forensics and biometrics, robotics and egovision, cultural heritage and document analysis, retrieval, and women at ICPR2020.
988			_aSpringer_Computer_2021
650		7	_2embne _aVisión por ordenador _9159793
650		7	_2embne _aReconocimiento de formas _9152614
700	1		_aDel Bimbo, Alberto _eeditor literario _0(orcid)0000-0002-1052-8322 _1https://orcid.org/0000-0002-1052-8322 _4edt _4http://id.loc.gov/vocabulary/relators/edt
700	1		_aCucchiara, Rita _eeditor literario _0(orcid)0000-0002-2239-283X _1https://orcid.org/0000-0002-2239-283X _4edt _4http://id.loc.gov/vocabulary/relators/edt
700	1		_aSclaroff, Stan _eeditor literario _0(orcid)0000-0002-0711-4313 _1https://orcid.org/0000-0002-0711-4313 _4edt _4http://id.loc.gov/vocabulary/relators/edt
700	1		_aFarinella, Giovanni Maria _eeditor literario _0(orcid)0000-0002-6034-0432 _1https://orcid.org/0000-0002-6034-0432 _4edt _4http://id.loc.gov/vocabulary/relators/edt
700	1		_aMei, Tao _eeditor literario _4edt _4http://id.loc.gov/vocabulary/relators/edt
700	1		_aBertini, Marco _eeditor literario _0(orcid)0000-0002-1364-218X _1https://orcid.org/0000-0002-1364-218X _4edt _4http://id.loc.gov/vocabulary/relators/edt
700	1		_aEscalante, Hugo Jair _eeditor literario _0(orcid)0000-0003-4603-3513 _1https://orcid.org/0000-0003-4603-3513 _4edt _4http://id.loc.gov/vocabulary/relators/edt
700	1		_aVezzani, Roberto _eeditor literario _0(orcid)0000-0002-1046-6870 _1https://orcid.org/0000-0002-1046-6870 _4edt _4http://id.loc.gov/vocabulary/relators/edt
710	2		_aSpringerLink
856	4	0	_uhttps://go.openathens.net/redirector/universidadeuropea.es?url=https://doi.org/10.1007/978-3-030-68790-8 _zAcceso a este recurso digital (usuarios Universidad Europea de Madrid)
942			_2lcc _cLE
998			_b04/2021 _dz _eb _zSI