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| 003 | ES-MaUEC | ||
| 005 | 20230102114034.0 | ||
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| 007 | cr nn nnnaamaa | ||
| 008 | 200426s2020 gw a o |||| 0|eng d | ||
| 020 | _a9783030375003 | ||
| 024 | 7 |
_a10.1007/978-3-030-37500-3 _2doi |
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| 040 |
_aES-MaUEC _bspa _cES-MaUEC _dES-MaUEC |
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| 050 | 4 |
_aTK7871.85 _b2020 EB |
|
| 245 | 0 | 0 |
_aNoise in Nanoscale Semiconductor Devices / _cedited by Tibor Grasser |
| 250 | _aFirst edition | ||
| 264 | 1 |
_aCham _bSpringer International Publishing : _bImprint: Springer _c2020 |
|
| 300 |
_a1 recurso en línea (VI, 729 páginas) _b550 ilustraciones, 443 ilustraciones a color |
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| 336 |
_2rdacontent _aTexto _btxt |
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| 337 |
_2rdamedia _aelectrónico _bc |
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| 338 |
_2rdacarrier _arecurso electrónico _bcr |
||
| 347 |
_aArchivo de texto _bPDF |
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| 490 | 0 | _aEngineering (Springer-11647) | |
| 520 | 3 | _aThis book summarizes the state-of-the-art, regarding noise in nanometer semiconductor devices. Readers will benefit from this leading-edge research, aimed at increasing reliability based on physical microscopic models. Authors discuss the most recent developments in the understanding of point defects, e.g. via ab initio calculations or intricate measurements, which have paved the way to more physics-based noise models which are applicable to a wider range of materials and features, e.g. III-V materials, 2D materials, and multi-state defects. Describes the state-of-the-art, regarding noise in nanometer semiconductor devices; Enables readers to design more reliable semiconductor devices; Offers the most up-to-date information on point defects, based on physical microscopic models. | |
| 988 | _aSpringer_Engineering_23062020 | ||
| 650 | 7 |
_aSemiconductores _2embne _9140004 |
|
| 650 | 7 |
_aRuido electrónico _2embne _9675069 |
|
| 650 | 7 |
_aNanotecnología _2embne _9158453 |
|
| 700 | 1 |
_aGrasser, Tibor _eeditor _4edt _4http://id.loc.gov/vocabulary/relators/edt _0http://id.loc.gov/authorities/names/n2003078844 _1http://viaf.org/viaf/346833 |
|
| 710 | 2 |
_aSpringerLink (Online service) _0http://id.loc.gov/authorities/names/no2005046756 _1http://viaf.org/viaf/148105729 |
|
| 776 | 0 | 8 |
_iPrinted edition: _z9783030374990 |
| 776 | 0 | 8 |
_iPrinted edition: _z9783030375010 |
| 776 | 0 | 8 |
_iPrinted edition: _z9783030375027 |
| 856 | 4 | 0 |
_uhttps://go.openathens.net/redirector/universidadeuropea.es?url=https://doi.org/10.1007/978-3-030-37500-3 _zAcceso a este recurso digital (usuarios Universidad Europea de Madrid) |
| 942 |
_2lcc _cLE |
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| 998 |
_b07/2020 _dz _eo _zSI |
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