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| 003 | ES-MaUEC | ||
| 005 | 20230102113846.0 | ||
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| 008 | 191211s2020 gw a o |||| 0|eng d | ||
| 020 | _a9783030357436 | ||
| 024 | 7 |
_a10.1007/978-3-030-35743-6 _2doi |
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| 040 |
_aES-MaUEC _bspa _cES-MaUEC _dES-MaUEC |
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| 050 | 4 |
_aTK7874 _b2020 EB |
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| 100 | 1 |
_aRosa, João P. S. _9673240 |
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| 245 | 1 | 0 |
_aUsing Artificial Neural Networks for Analog Integrated Circuit Design Automation _cby João P. S. Rosa, Daniel J. D. Guerra, Nuno C. G. Horta, Ricardo M. F. Martins, Nuno C. C. Lourenço |
| 250 | _aPrimera edición 2020 | ||
| 264 | 1 |
_aCham _bSpringer _c2020 |
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| 300 | _a1 recurso en línea (XVIII, 101 páginas) | ||
| 336 |
_2rdacontent _aTexto _btxt |
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| 337 |
_2rdamedia _aelectrónico _bc |
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| 338 |
_2rdacarrier _arecurso electrónico _bcr |
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| 347 |
_atext file _bPDF |
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| 490 | 0 |
_aSpringerBriefs in Applied Sciences and Technology _x2191-530X |
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| 505 | 0 | _aIntroduction -- Related Work -- Overview of Artificial Neural Networks (ANNs) -- On the Exploration of Promising Analog IC Designs via ANNs -- ANNs as an Alternative for Automatic Analog IC Placement -- Conclusions. . | |
| 520 | 3 | _aThis book addresses the automatic sizing and layout of analog integrated circuits (ICs) using deep learning (DL) and artificial neural networks (ANN). It explores an innovative approach to automatic circuit sizing where ANNs learn patterns from previously optimized design solutions. In opposition to classical optimization-based sizing strategies, where computational intelligence techniques are used to iterate over the map from devices' sizes to circuits' performances provided by design equations or circuit simulations, ANNs are shown to be capable of solving analog IC sizing as a direct map from specifications to the devices' sizes. Two separate ANN architectures are proposed: a Regression-only model and a Classification and Regression model. The goal of the Regression-only model is to learn design patterns from the studied circuits, using circuit's performances as input features and devices' sizes as target outputs. This model can size a circuit given its specifications for a single topology. The Classification and Regression model has the same capabilities of the previous model, but it can also select the most appropriate circuit topology and its respective sizing given the target specification. The proposed methodology was implemented and tested on two analog circuit topologies. . | |
| 988 | _aPrimersemestre_2020_Engineering | ||
| 650 | 7 |
_2embne _aCircuitos integrados _xDiseño y construcción _9179611 |
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| 700 | 1 |
_aGuerra, Daniel J. D. _eautor |
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| 700 | 1 |
_aHorta, Nuno C. G. _eautor |
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| 700 | 1 |
_aMartins, Ricardo M. F. _eautor |
|
| 700 | 1 |
_aLourenço, Nuno C. C. _eautor |
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| 773 | 0 | _tSpringer eBooks | |
| 776 | 0 | 8 |
_iPrinted edition: _z9783030357429 |
| 776 | 0 | 8 |
_iPrinted edition: _z9783030357443 |
| 856 | 4 | 0 |
_uhttps://go.openathens.net/redirector/universidadeuropea.es?url=https://doi.org/10.1007/978-3-030-35743-6 _zAcceso a este recurso digital (usuarios Universidad Europea de Madrid) |
| 942 |
_2lcc _cLE _n0 |
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| 998 |
_b04/2020 _dz _eu _zSI |
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