| 000 | 02931nam a22003975i 4500 | ||
|---|---|---|---|
| 988 | _aSpringer_Engineering_2020 | ||
| 999 |
_c116826 _d116826 _x1 |
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| 001 | 116826 | ||
| 003 | ES-MaUEC | ||
| 005 | 20230110040247.0 | ||
| 006 | a||||fo|||| 00| 0 | ||
| 007 | cr nn nnnaamaa | ||
| 008 | 190930s2020 gw | s |||| 0|eng d | ||
| 020 | _a9783030237813 | ||
| 024 | 7 |
_a10.1007/978-3-030-23781-3 _2doi |
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| 040 |
_aES-MaUEC _bspa _cES-MaUEC _dES-MaUEC |
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| 050 | 4 |
_aTK7888.4 _b2020 EB |
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| 245 | 0 | 0 |
_aAgeing of Integrated Circuits : _bCauses, Effects and Mitigation Techniques _cedited by Basel Halak. |
| 250 | _a1st ed. 2020. | ||
| 264 | 1 |
_aCham _bSpringer International Publishing _c2020. |
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| 300 |
_a1 recurso en línea (XIII, 228 páginas) _b145 ilustraciones, 107 ilustraciones a color |
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| 336 |
_2rdacontent _aTexto _btxt |
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| 337 |
_2rdamedia _aelectrónico _bc |
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| 338 |
_2rdacarrier _arecurso electrónico _bcr |
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| 347 |
_atext file _bPDF |
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| 490 | 0 | _aEngineering (Springer-11647) | |
| 505 | 0 | _aChapter 1. Understanding Ageing Mechanisms -- Chapter 2. The Effects of Ageing on the reliability and performance of Integrated Circuits -- Chapter 3. Ageing Mitigation Techniques for Microprocessors using using Anti- Ageing Software -- Chapter 4. Ageing Mitigation Techniques for SRAM Memories -- Chapter 5. Ageing-aware Logic Synthesis -- Chapter 6. On-Chip Ageing Monitoring and System Adaptation -- Chapter 7. Aging Monitors for SRAM Memory Cells and Sense Amplifiers -- Chapter 8. A Cost-Efficient Aging Sensor based on Multiple Paths Delay Fault Monitoring. | |
| 520 | _aThis book provides comprehensive coverage of the latest research into integrated circuits' ageing, explaining the causes of this phenomenon, describing its effects on electronic systems, and providing mitigation techniques to build ageing-resilient circuits. Describes in detail the physical mechanisms of CMOS ageing; Provides an in-depth discussion on the impact of ageing on the performance and reliability of integrated circuits; Presents state-of-the art synthesis algorithms for ageing resilient digital systems; Introduces application-dependent techniques to mitigate the effects of aging; Discusses the design and implementation of on-chip aging monitoring sensors for aging-adaptable systems; Includes more than 200 references on state-of-art research in this area, providing direction for further reading. | ||
| 650 | 7 |
_2embne _aCircuitos eléctricos _9139226 |
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| 700 | 1 |
_aHalak, Basel _eeditor _4edt _4http://id.loc.gov/vocabulary/relators/edt |
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| 776 | 0 | 8 |
_iPrinted edition: _z9783030237806 |
| 776 | 0 | 8 |
_iPrinted edition: _z9783030237820 |
| 776 | 0 | 8 |
_iPrinted edition: _z9783030237837 |
| 856 | 4 | 0 |
_uhttps://go.openathens.net/redirector/universidadeuropea.es?url=https://doi.org/10.1007/978-3-030-23781-3 _zAcceso a este recurso digital (usuarios Universidad Europea de Madrid) |
| 942 |
_2lcc _cLE |
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| 998 |
_aSI _cm _dz _feng _ggw _h0 _b01/2020 _eIG _zSI |
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