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020 _a9783030237813
024 7 _a10.1007/978-3-030-23781-3
_2doi
040 _aES-MaUEC
_bspa
_cES-MaUEC
_dES-MaUEC
050 4 _aTK7888.4
_b2020 EB
245 0 0 _aAgeing of Integrated Circuits :
_bCauses, Effects and Mitigation Techniques
_cedited by Basel Halak.
250 _a1st ed. 2020.
264 1 _aCham
_bSpringer International Publishing
_c2020.
300 _a1 recurso en línea (XIII, 228 páginas)
_b145 ilustraciones, 107 ilustraciones a color
336 _2rdacontent
_aTexto
_btxt
337 _2rdamedia
_aelectrónico
_bc
338 _2rdacarrier
_arecurso electrónico
_bcr
347 _atext file
_bPDF
490 0 _aEngineering (Springer-11647)
505 0 _aChapter 1. Understanding Ageing Mechanisms -- Chapter 2. The Effects of Ageing on the reliability and performance of Integrated Circuits -- Chapter 3. Ageing Mitigation Techniques for Microprocessors using using Anti- Ageing Software -- Chapter 4. Ageing Mitigation Techniques for SRAM Memories -- Chapter 5. Ageing-aware Logic Synthesis -- Chapter 6. On-Chip Ageing Monitoring and System Adaptation -- Chapter 7. Aging Monitors for SRAM Memory Cells and Sense Amplifiers -- Chapter 8. A Cost-Efficient Aging Sensor based on Multiple Paths Delay Fault Monitoring.
520 _aThis book provides comprehensive coverage of the latest research into integrated circuits' ageing, explaining the causes of this phenomenon, describing its effects on electronic systems, and providing mitigation techniques to build ageing-resilient circuits. Describes in detail the physical mechanisms of CMOS ageing; Provides an in-depth discussion on the impact of ageing on the performance and reliability of integrated circuits; Presents state-of-the art synthesis algorithms for ageing resilient digital systems; Introduces application-dependent techniques to mitigate the effects of aging; Discusses the design and implementation of on-chip aging monitoring sensors for aging-adaptable systems; Includes more than 200 references on state-of-art research in this area, providing direction for further reading.
650 7 _2embne
_aCircuitos eléctricos
_9139226
700 1 _aHalak, Basel
_eeditor
_4edt
_4http://id.loc.gov/vocabulary/relators/edt
776 0 8 _iPrinted edition:
_z9783030237806
776 0 8 _iPrinted edition:
_z9783030237820
776 0 8 _iPrinted edition:
_z9783030237837
856 4 0 _uhttps://go.openathens.net/redirector/universidadeuropea.es?url=https://doi.org/10.1007/978-3-030-23781-3
_zAcceso a este recurso digital (usuarios Universidad Europea de Madrid)
942 _2lcc
_cLE
998 _aSI
_cm
_dz
_feng
_ggw
_h0
_b01/2020
_eIG
_zSI