000			03398nam a2200409 c 4500
942			_2lcc _cLE
988			_aSpringer_Engineering_2020
999			_c114566 _d114566 _x1
001			114566
003			ES-MaUEC
005			20230110040226.0
006			a||||fo|||| 00| 0
007			cr nn nnnaamaa
008			190930s2020 gw a o |||| 0|eng d
020			_a9783030293536
024	7		_a10.1007/978-3-030-29353-6 _2doi
040			_aES-MaUEC _bspa _cES-MaUEC _dES-MaUEC
050		4	_aTK7874 _b2020 EB
100	1		_aBastos, Rodrigo Possamai _eautor _9671582
245	1	0	_aOn-Chip Current Sensors for Reliable, Secure, and Low-Power Integrated Circuits _cby Rodrigo Possamai Bastos, Frank Sill Torres.
250			_a1st ed. 2020.
264		1	_aCham _bSpringer International Publishing _c2020
300			_a1 recurso en línea (XXXII, 162 páginas) _b80 ilustraciones, 50 ilustraciones a color
336			_2rdacontent _aTexto _btxt
337			_2rdamedia _aelectrónico _bc
338			_2rdacarrier _arecurso electrónico _bcr
347			_atext file _bPDF
490	0		_aEngineering (Springer-11647)
505	0		_aChapter 1. Effects of transient faults in integrated circuits -- Chapter 2. Effectiveness of hardware-level techniques in detecting transient faults -- Chapter 3. Architectures of body built-in current sensors for detection of transient faults -- Chapter 4. Enhancing the design of body built-in sensor architectures -- Chapter 5. Noise robustness of body built-in sensors -- Chapter 6. Body built-in cells for detecting transient faults and adaptively biasing subcircuits -- Chapter 7. Automatic integration of body built-in sensors into digital design flows -- Chapter 8. Body built-in sensors for testing integrated circuit systems for hardware Trojans.
520	3		_aThis book provides readers with insight into an alternative approach for enhancing the reliability, security, and low power features of integrated circuit designs, related to transient faults, hardware Trojans, and power consumption. The authors explain how the addition of integrated sensors enables the detection of ionizing particles and how this information can be processed at a high layer. The discussion also includes a variety of applications, such as the detection of hardware Trojans and fault attacks, and how sensors can operate to provide different body bias levels and reduce power costs. Readers can benefit from these sensors-based approaches through designs with fast response time, non-intrusive integration on gate-level and reasonable design costs. Presents a unique approach for detection of radiation-induced transient faults in integrated circuits; Describes the effects of ionizing particles in the transistor body and discusses its exploitation; Includes innovative presentation of the multiple roles of body built-in sensors for reliability, security, and low-power applications.
650		7	_2embne _aCircuitos integrados _9139614
700	1		_aTorres, Frank Sill _eautor _4aut _4http://id.loc.gov/vocabulary/relators/aut
776	0	8	_iPrinted edition: _z9783030293529
776	0	8	_iPrinted edition: _z9783030293543
776	0	8	_iPrinted edition: _z9783030293550
856	4	0	_uhttps://go.openathens.net/redirector/universidadeuropea.es?url=https://doi.org/10.1007/978-3-030-29353-6 _zAcceso a este recurso digital (usuarios Universidad Europea de Madrid)
998			_aSI _cm _dz _feng _ggw _h0 _b12/2019 _ek _zSI