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020 _a9783319912042
024 7 _a10.1007/978-3-319-91204-2
_2doi
040 _bspa
_dES-MaUEC
_cES-MaUEC
050 4 _aTK7895.M4
_b2019 EB
100 1 _aMrozek, Ireneusz
_eautor
_4aut
_4http://id.loc.gov/vocabulary/relators/aut
_9673545
245 1 0 _aMulti-run Memory Tests for Pattern Sensitive Faults
_cIreneusz Mrozek.
264 1 _aCham
_bSpringer International Publishing :
_bImprint: Springer
_c2019.
300 _a1 recurso en línea (X, 135 páginas)
_b34 ilustraciones
336 _2rdacontent
_aTexto
_btxt
337 _2rdamedia
_aelectrónico
_bc
338 _2rdacarrier
_arecurso electrónico
_bcr
347 _atext file
_bPDF
490 0 _aEngineering (Springer-11647)
505 0 _aIntroduction to digital memory -- Basics of functional RAM testing -- Multi-cell faults -- Controlled random testing -- Multi-run tests based on background changing -- Multi-run tests based on address changing -- Multiple controlled random testing -- Pseudo exhaustive testing based on march tests -- Conclusion.
520 3 _aThis book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author discusses background selection and address reordering algorithms in multi-run transparent march testing processes. Formal methods for multi-run test generation and many solutions to increase their efficiency are described in detail. All methods presented ideas are verified by both analytical investigations and numerical simulations. Provides the first book related exclusively to the problem of multi-cell fault detection by multi-run tests in memory testing process; Presents practical algorithms for design and implementation of efficient multi-run tests; Demonstrates methods verified by analytical and experimental investigations.
988 _aPrimersemestre_2019_Engineering
650 7 _aDispositivos de almacenamiento de datos
_2embne
_9670359
776 0 8 _iPrinted edition:
_z9783030081980
776 0 8 _iPrinted edition:
_z9783319912035
776 0 8 _iPrinted edition:
_z9783319912059
856 4 0 _uhttps://go.openathens.net/redirector/universidadeuropea.es?url=https://doi.org/10.1007/978-3-319-91204-2
_zAcceso a este recurso digital (usuarios Universidad Europea de Madrid)
942 _2lcc
_cLE
998 _dz
_feng
_ggw
_h0
_b05/2020
_eo
_zSI