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_aSpringerLink (Online service) _9106996 |
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_c110651 _d110651 _x1 |
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| 001 | 110651 | ||
| 003 | ES-MaUEC | ||
| 005 | 20230102113431.0 | ||
| 008 | 180901s2019 gw a o |||| 0|eng d | ||
| 020 | _a9783319981161 | ||
| 024 | 7 |
_a10.1007/978-3-319-98116-1 _2doi |
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_bspa _dES-MaUEC _cES-MaUEC |
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| 050 | 4 |
_aQA76.9 .D43 _b2019 EB |
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| 245 | 0 | 0 |
_aPost-Silicon Validation and Debug _cedited by Prabhat Mishra, Farimah Farahmandi |
| 264 | 1 |
_aCham _bSpringer International Publishing ; _bImprint: Springer _c2019 |
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| 300 |
_a1 recurso en línea (XV, 394 páginas) _b189 ilustraciones, 113 ilustraciones a color |
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| 336 |
_2rdacontent _aTexto _btxt |
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_2rdamedia _aelectrónico _bc |
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_2rdacarrier _arecurso electrónico _bcr |
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| 347 |
_atext file _bPDF |
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| 490 | 0 | _aEngineering (Springer-11647) | |
| 505 | 0 | _aPart 1. Introduction -- Post-Silicon SoC Validation Challenges -- Part 2. Debug Infrastructure -- SoC Instrumentations: Pre-silicon Preparation for Post-silicon Readiness -- Structure-based Signal Selection for Post-silicon Validation -- Simulation-based Signal Selection -- Hybrid Signal Selection -- Post-Silicon Signal Selection using Machine Learning -- Part 3. Generation of Tests and Assertions -- Observability-aware Post-Silicon Test Generation -- On-chip Constrained-Random Stimuli Generation -- Test Generation and Lightweight Checking for Multi-core Memory Consistency -- Selection of Post-Silicon Hardware Assertions -- Part 4. Post-Silicon Debug -- Debug Data Reduction Techniques -- High-level Debugging of Post-silicon Failures -- Post-silicon Fault Localization with Satisfiability Solvers -- Coverage Evaluation and Analysis of Post-silicon Tests with Virtual Prototypes -- Utilization of Debug Infrastructure for Post-Silicon Coverage Analysis -- Part 5. Case Studies -- Network-on-Chip Validation and Debug -- Post-silicon Validation of the IBM Power8 Processor -- Part 6. Conclusion and Future Directions -- SoC Security versus Post-Silicon Debug Conflict -- The Future of Post-Silicon Debug. | |
| 520 | 3 | _aThis book provides a comprehensive coverage of System-on-Chip (SoC) post-silicon validation and debug challenges and state-of-the-art solutions with contributions from SoC designers, academic researchers as well as SoC verification experts. The readers will get a clear understanding of the existing debug infrastructure and how they can be effectively utilized to verify and debug SoCs. Provides a comprehensive overview of the SoC post-silicon validation and debug challenges; Covers state-of-the-art techniques for developing on-chip debug infrastructure; Describes automated techniques for generating post-silicon tests and assertions to enable effective post-silicon debug and coverage analysis; Covers scalable post-silicon validation and bug localization using a combination of simulation-based techniques and formal methods; Presents case studies for post-silicon debug of industrial SoC designs. | |
| 988 | _aPrimersemestre_2019_Engineering | ||
| 650 | 7 |
_2embne _9670306 _aDepuración (Informática) |
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| 700 | 1 |
_aFarahmandi, Farimah. _eeditor literario |
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| 700 | 1 |
_aMishra, Prabhat. _eeditor literario |
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| 776 | 0 | 8 |
_iPrinted edition: _z9783030074548 |
| 776 | 0 | 8 |
_iPrinted edition: _z9783319981154 |
| 776 | 0 | 8 |
_iPrinted edition: _z9783319981178 |
| 856 | 4 | 0 |
_uhttps://go.openathens.net/redirector/universidadeuropea.es?url=https://doi.org/10.1007/978-3-319-98116-1 _zAcceso a este recurso digital (usuarios Universidad Europea de Madrid) |
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_2lcc _cLE |
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_aSI _cm _dz _feng _ggw _h0 _b08/2019 _eu _zSI |
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