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020 _a9783319981161
024 7 _a10.1007/978-3-319-98116-1
_2doi
040 _bspa
_dES-MaUEC
_cES-MaUEC
050 4 _aQA76.9 .D43
_b2019 EB
245 0 0 _aPost-Silicon Validation and Debug
_cedited by Prabhat Mishra, Farimah Farahmandi
264 1 _aCham
_bSpringer International Publishing ;
_bImprint: Springer
_c2019
300 _a1 recurso en línea (XV, 394 páginas)
_b189 ilustraciones, 113 ilustraciones a color
336 _2rdacontent
_aTexto
_btxt
337 _2rdamedia
_aelectrónico
_bc
338 _2rdacarrier
_arecurso electrónico
_bcr
347 _atext file
_bPDF
490 0 _aEngineering (Springer-11647)
505 0 _aPart 1. Introduction -- Post-Silicon SoC Validation Challenges -- Part 2. Debug Infrastructure -- SoC Instrumentations: Pre-silicon Preparation for Post-silicon Readiness -- Structure-based Signal Selection for Post-silicon Validation -- Simulation-based Signal Selection -- Hybrid Signal Selection -- Post-Silicon Signal Selection using Machine Learning -- Part 3. Generation of Tests and Assertions -- Observability-aware Post-Silicon Test Generation -- On-chip Constrained-Random Stimuli Generation -- Test Generation and Lightweight Checking for Multi-core Memory Consistency -- Selection of Post-Silicon Hardware Assertions -- Part 4. Post-Silicon Debug -- Debug Data Reduction Techniques -- High-level Debugging of Post-silicon Failures -- Post-silicon Fault Localization with Satisfiability Solvers -- Coverage Evaluation and Analysis of Post-silicon Tests with Virtual Prototypes -- Utilization of Debug Infrastructure for Post-Silicon Coverage Analysis -- Part 5. Case Studies -- Network-on-Chip Validation and Debug -- Post-silicon Validation of the IBM Power8 Processor -- Part 6. Conclusion and Future Directions -- SoC Security versus Post-Silicon Debug Conflict -- The Future of Post-Silicon Debug.
520 3 _aThis book provides a comprehensive coverage of System-on-Chip (SoC) post-silicon validation and debug challenges and state-of-the-art solutions with contributions from SoC designers, academic researchers as well as SoC verification experts. The readers will get a clear understanding of the existing debug infrastructure and how they can be effectively utilized to verify and debug SoCs. Provides a comprehensive overview of the SoC post-silicon validation and debug challenges; Covers state-of-the-art techniques for developing on-chip debug infrastructure; Describes automated techniques for generating post-silicon tests and assertions to enable effective post-silicon debug and coverage analysis; Covers scalable post-silicon validation and bug localization using a combination of simulation-based techniques and formal methods; Presents case studies for post-silicon debug of industrial SoC designs.
988 _aPrimersemestre_2019_Engineering
650 7 _2embne
_9670306
_aDepuración (Informática)
700 1 _aFarahmandi, Farimah.
_eeditor literario
700 1 _aMishra, Prabhat.
_eeditor literario
776 0 8 _iPrinted edition:
_z9783030074548
776 0 8 _iPrinted edition:
_z9783319981154
776 0 8 _iPrinted edition:
_z9783319981178
856 4 0 _uhttps://go.openathens.net/redirector/universidadeuropea.es?url=https://doi.org/10.1007/978-3-319-98116-1
_zAcceso a este recurso digital (usuarios Universidad Europea de Madrid)
942 _2lcc
_cLE
998 _aSI
_cm
_dz
_feng
_ggw
_h0
_b08/2019
_eu
_zSI