000			05120nam a22004095i 4500
006			a||||fo|||| 00| 0
007			cr nn nnnaamaa
710	2		_aSpringerLink (Online service) _9106996
999			_c110480 _d110480 _x1
001			110480
003			ES-MaUEC
005			20230102113423.0
008			180720s2019 ja a o |||| 0|eng d
020			_a9784431565949
024	7		_a10.1007/978-4-431-56594-9 _2doi
040			_bspa _dES-MaUEC _cES-MaUEC
050		4	_aTK7874 _b2019 EB
245	0	0	_aVLSI Design and Test for Systems Dependability _cShojiro Asai, editor
264		1	_aTokyo _bSpringer Japan : _bImprint: Springer _c2019
300			_a1 recurso en línea (XVII, 800 páginas) _b585 ilustraciones
336			_2rdacontent _aTexto _btxt
337			_2rdamedia _aelectrónico _bc
338			_2rdacarrier _arecurso electrónico _bcr
347			_atext file _bPDF
490	0		_aEngineering (Springer-11647)
505	0		_aChallenges and Opportunities in VLSI for Systems Dependability -- Design and Development of Electronic Systems for Quality and Dependability -- Radiation-Induced Soft Errors -- Electromagnetic Noises -- Variations in Device Characteristics -- Time-Dependent Degradation in Device Characteristics -- Connectivity in Wireless Telecommunications -- Connectivity in Electronic Packaging -- Responsiveness for Hard Real Time Control -- The Role of Security LSI and the Example of Malicious Attacks -- Verification and Test Coverage -- Unknown Threats and Provisions -- Design Automation for Reliability -- Formal Verification and Debugging of VLSI Logic Design for Systems Dependability:Experiments and Evaluation -- Virtualization: System-Level Fault Simulation of SRAM Errors in  Automotive Electronic Control Systems -- DART - A Concept of In-Field Testing for Enhancing System De-pendability -- Design of SRAM Resilient against Dynamic Voltage Variations -- Design and Applications of Dependable Non-Volatile Memory Systems -- Network-on-Chip Based Multiple-Core Centrized ECUs for Safety-Critical Automotive Applications -- An On-Chip Router Architecture for Dependable Multicore Processor -- Wireless Interconnect in Electronic Systems -- Wireless Power Delivery Resilient against Loading Variations -- Extended Dependable Air: Use of Satellites in Boosting Dependability of PublicWireless Communications -- Responsive Multithreaded Processor for Hard Real-Time Robotic Applications -- A Low-Latency DMR Architecture with Fast Checkpoint Recovery Scheme Using  Simultaneously Copyable SRAM -- A 3D-VLSI Architecture for Future Automotive Visual Recognition -- Applications of Reconfigurable Processors as Embedded Automatons in the IoT Sensor Networks in Space -- An FPGA Implementation of Comprehensive Security Functions for Systems-Level Authentication -- SRAM-Based Physically Unclonable Functions (PUFs) to Generate Signature out of Silicon for Authentication and Encryption.
520	3		_aThis book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems. The book consists of three parts. Part I, as a general introduction to this vital topic, describes how electronic systems are designed and tested with particular emphasis on dependability engineering, where the simultaneous assessment of the detrimental outcome of failures and cost of their containment is made. This section also describes the related research project "Dependable VLSI Systems," in which the editor and authors of the book were involved for 8 years. Part II addresses various threats to the dependability of VLSIs as key systems components, including time-dependent degradations, variations in device characteristics, ionizing radiation, electromagnetic interference, design errors, and tampering, with discussion of technologies to counter those threats. Part III elaborates on the design and test technologies for dependability in such applications as control of robots and vehicles, data processing, and storage in a cloud environment and heterogeneous wireless telecommunications. This book is intended to be used as a reference for engineers who work on the design and testing of VLSI systems with particular attention to dependability. It can be used as a textbook in graduate courses as well. Readers interested in dependable systems from social and industrial-economic perspectives will also benefit from the discussions in this book.
988			_aPrimersemestre_2019_Engineering
650		7	_2embne _9138689 _aMicroelectrónica
650		7	_9670141 _aCircuitos integrados VLSI _2embne
700	1		_aAsai, Shojiro. _eeditor literario _4edt _4http://id.loc.gov/vocabulary/relators/edt
776	0	8	_iPrinted edition: _z9784431565925
776	0	8	_iPrinted edition: _z9784431565932
776	0	8	_iPrinted edition: _z9784431568636
856	4	0	_uhttps://go.openathens.net/redirector/universidadeuropea.es?url=https://doi.org/10.1007/978-4-431-56594-9 _zAcceso a este recurso digital (usuarios Universidad Europea de Madrid)
942			_2lcc _cLE
998			_aSI _cm _dz _feng _ggw _h0 _b07/2019 _eel _zSI