000			04574nam a22004215i 4500
006			a||||fo|||| 00| 0
007			cr nn nnnaamaa
710	2		_aSpringerLink (Online service) _9106996
999			_c110344 _d110344 _x1
001			110344
003			ES-MaUEC
005			20230102113416.0
008			190410s2019 gw a o |||| 0|eng d
020			_a9783030046606
024	7		_a10.1007/978-3-030-04660-6 _2doi
040			_bspa _dES-MaUEC _cES-MaUEC
050		4	_aTL790 _b2019 EB
245	0	0	_aRadiation Effects on Integrated Circuits and Systems for Space Applications _cedited by Raoul Velazco, Dale McMorrow, Jaime Estela.
264		1	_aCham _bSpringer International Publishing : _bImprint: Springer _c2019.
300			_a1 recurso en línea (IX, 401 páginas) _b192 ilustraciones, 141 ilustraciones a color
336			_2rdacontent _aTexto _btxt
337			_2rdamedia _aelectrónico _bc
338			_2rdacarrier _arecurso electrónico _bcr
347			_atext file _bPDF
490	0		_aEngineering (Springer-11647)
505	0		_aChapter1: Space and Radiation Environments -- Chapter2: System-Level Modeling and Analysis fo the Vulnerability of a Processor to SEU -- Chapter3: Single Event Effects Test Methods -- Chapter4: Characteristics and Applications of Pulsed-Laser-Induced Single-Event Effects -- Chapter5: Microprocessor Testing -- Chapter6: Fault Injection Methodologies -- Chapter7: Mitigation techniques and Error prediction applied in Multicore processors -- Chapter8: Improving reliability of multi/many-core processors by using NMR-MPar approach -- Chapter9: System Hardening and Real Applications -- Chapter10: Backward Error Recovery in SRAM based FPGA -- Chapter11: Development of a Hardened 150nm Standard Cell library -- Chapter12: COTS in Space: Constraints, Limitations and Disruptive Capability -- Chapter13: COTS & the NewSpace -- Chapter14: The Phoenix GPS Receiver for Rocket and Satellite Applications - An Example for the Successful Utilization of COTS Technology in Space Projects -- Chapter15: Simulation-based Radiation Hardness Assurance for ATHENA-WFI -- Chapter16: COTS for Deep Space Missions.
520	3		_aThis book provides readers with invaluable overviews and updates of the most important topics in the radiation-effects field, enabling them to face significant challenges in the quest for the insertion of ever-higher density and higher performance electronic components in satellite systems. Readers will benefit from the up-to-date coverage of the various primary (classical) sub-areas of radiation effects, including the space and terrestrial radiation environments, basic mechanisms of total ionizing dose, digital and analog single-event transients, basic mechanisms of single-event effects, system-level SEE analysis, device-level, circuit-level and system-level hardening approaches, and radiation hardness assurance. Additionally, this book includes in-depth discussions of several newer areas of investigation, and current challenges to the radiation effects community, such as radiation hardening by design, the use of Commercial-Off-The-Shelf (COTS) components in space missions, CubeSats and SmallSats, the use of recent generation FPGA's in space, and new approaches for radiation testing and validation. The authors provide essential background and fundamentals, in addition to information on the most recent advances and challenges in the sub-areas of radiation effects. Provides a concise introduction to the fundamentals of radiation effects, latest research results, and new test methods and procedures; Discusses the radiation effects and mitigation solutions for advanced integrated circuits and systems designed to operate in harsh radiation environments; Includes coverage of the impact of Small Satellites in the space industry.
988			_aPrimersemestre_2019_Engineering
650		7	_2embne _aAstronáutica _9138156
650		7	_2embne _9139696 _aVehículos espaciales
700	1		_aEstela, Jaime. _eeditor literario _4edt _4http://id.loc.gov/vocabulary/relators/edt
700	1		_aMcMorrow, Dale. _eeditor literario _4edt _4http://id.loc.gov/vocabulary/relators/edt
700	1		_aVelazco, Raoul. _eeditor literario _4edt _4http://id.loc.gov/vocabulary/relators/edt
776	0	8	_iPrinted edition: _z9783030046590
776	0	8	_iPrinted edition: _z9783030046613
856	4	0	_uhttps://go.openathens.net/redirector/universidadeuropea.es?url=https://doi.org/10.1007/978-3-030-04660-6 _zAcceso a este recurso digital (usuarios Universidad Europea de Madrid)
942			_2lcc _cLE
998			_aSI _cm _dz _feng _ggw _h0 _b09/2019 _ejf _zSI