000			03076nam a22004215i 4500
999			_c108116 _d108116
001			108116
003			DE-He213
005			20230102113334.0
006			a||||fo|||| 00| 0
007			cr nn 008mamaa
008			180403s2018 gw | s |||| 0|eng d
020			_a9783319777184
024	7		_a10.1007/978-3-319-77718-4 _2doi
040			_bspa _dES-MaUEC _cES-MaUEC
050		4	_aTK7868.D5 _b2018 EB
100	1		_aZhuang, Yuming _eautor _4aut _4http://id.loc.gov/vocabulary/relators/aut _9669616
245	1	0	_aAccurate and Robust Spectral Testing with Relaxed Instrumentation Requirements _cby Yuming Zhuang, Degang Chen.
264		1	_aCham _bSpringer International Publishing : _bImprint: Springer _c2018.
300			_a (1 recurso en línea XIV, 170 páginas, 89 ilustraciones, 88 ilustraciones a color)
336			_2rdacontent _aTexto (visual) _btxt
337			_2rdamedia _aelectrónico _bc
338			_2rdacarrier _arecurso electrónico _bcr
347			_atext file _bPDF _2rda
490			_aEngineering (Springer-11647)
500			_aEBSPRINGER_ENGINEERING_FEB2019
505	0		_aChapter 1. Introduction -- Chapter 2.Algorithms for accurate spectral analysis in the presence of arbitrary non-coherency and large distortion -- Chapter 3.Accurate spectral testing with arbitrary non- coherency in sampling and simultaneous drifts in amplitude and frequency -- Chapter 4.High-purity sine wave generation using nonlinear DAC with pre-distortion based on low-cost accurate DAC-ADC co-testing -- Chapter 5.Low cost ultra-pure sine wave generation with self-calibration -- Chapter 6.Accurate spectral testing with non-coherent sampling for multi-tone test -- Chapter 7.Accurate spectral testing with impure test stimulus for multi-tone test -- Chapter 8.Multi-tone sine wave generation achieving the theoretical minimum of peak-to-average power ratio -- Chapter 9.Accurate linearity testing using low purity stimulus robust against flicker noise -- Chapter 10.Summary.
520			_aThis book introduces a family of new methods for accurate and robust spectral testing and fills an information gap, as the requirements in standard test have grown increasingly challenging in recent high precision testing, especially as the device performance has continued to improve. Test engineers will be enabled to accurately set their devices & systems at much simpler test setup, much reduced complexity and much lower cost.
988			_aEBSPRINGER_ENGINEERING_FEB2019
650		7	_2embne _aElectrónica digital _9141102
650		7	_2embne _9168886 _aMedición _xAparatos e instrumentos
700	1		_aChen, Degang _eautor _4aut _4http://id.loc.gov/vocabulary/relators/aut
710	2		_aSpringerLink (Online service) _9106996
776	0	8	_iPrinted edition: _z9783319777177
776	0	8	_iPrinted edition: _z9783319777191
856	4	0	_uhttps://go.openathens.net/redirector/universidadeuropea.es?url=https://doi.org/10.1007/978-3-319-77718-4 _zAcceso a este recurso digital (usuarios Universidad Europea de Madrid)
942			_2lcc _cLE
998			_b06/2019 _dz _feng _ggw _h0