000			03434nam a22003855i 4500
001			104020
003			DE-He213
005			20230102113156.0
007			cr nn 008mamaa
008			150310s2015 gw | s |||| 0|eng d
020			_a9783319108193
024	7		_a10.1007/978-3-319-10819-3 _2doi
040			_aES-MaUEC _bspa _cES-MaUEC
050		4	_aTK7874.78 2015 EB
100	1		_aCui, Qiang _eautor _9669764
245	1	0	_aOn-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits _cby Qiang Cui, Juin J. Liou, Jean-Jacques Hajjar, Javier Salcedo, Yuanzhong Zhou, Parthasarathy Srivatsan.
264		1	_aCham _bSpringer International Publishing _c2015
300			_a1 recurso en línea (XVII, 86 páginas 59 ilustraciones, 42 ilustraciones a color.)
505	0		_aBasics in ESD Protection of Radio Frequency Integrated Circuits -- On-Chip Protection Solution for Radio Frequency Integrated Circuits in Standard CMOS Process -- Design of SiGe SCR devices for Radio Frequency Integrated Circuits in SiGe BiCMOS Process -- On-Chip Radio Frequency ESD Protection Solution in GaAs pHEMT Process -- Conclusion.
520	3		_aThis book enables readers to design effective ESD protection solutions for all mainstream RF fabrication processes (GaAs pHEMT, SiGe HBT, CMOS). The new techniques introduced by the authors have much higher protection levels and much lower parasitic effects than those of existing ESD protection devices. The authors describe in detail the ESD phenomenon, as well as ESD protection fundamentals, standards, test equipment, and basic design strategies. Readers will benefit from realistic case studies of ESD protection for RFICs and will learn to increase significantly modern RFICs' ESD safety level, while maximizing RF performance. Describes in detail the ESD phenomenon, as well as ESD protection fundamentals, standards, test equipment, and basic design strategies; Enables readers to design effective ESD protection solutions for all mainstream RF fabrication processes (GaAs pHEMT, SiGe HBT, CMOS); Includes realistic case studies of ESD protection for RFICs that resulted in significantly increased ESD safety level, while maximizing RF performance.
650		7	_aCircuitos integrados _2embne _9139614
650		7	_aSistemas de identificación por radiofrecuencia _2embne _9427826
700	1		_aLiou, Juin J. _eautor _4aut _4http://id.loc.gov/vocabulary/relators/aut _0http://id.loc.gov/authorities/names/n93104714 _1http://viaf.org/viaf/37006991/ _967164
700	1		_aHajjar, Jean-Jacques _eautor _4aut _4http://id.loc.gov/vocabulary/relators/aut
700	1		_aSalcedo, Javier _eautor _4aut _4http://id.loc.gov/vocabulary/relators/aut _0http://id.loc.gov/authorities/names/n2013044049 _1http://viaf.org/viaf/81075662/
700	1		_aZhou, Yuanzhong _eautor _4aut _4http://id.loc.gov/vocabulary/relators/aut
700	1		_aSrivatsan, Parthasarathy _eautor _4aut _4http://id.loc.gov/vocabulary/relators/aut
776	0	8	_iEdición impresa: _z9783319108186
776	0	8	_iEdición impresa: _z9783319108209
776	0	8	_iEdición impresa: _z9783319358246
856	4	0	_uhttps://go.openathens.net/redirector/universidadeuropea.es?url=https://doi.org/10.1007/978-3-319-10819-3 _zAcceso a este recurso digital (usuarios Universidad Europea de Madrid)
490	0		_aEngineering (Springer-11647)
988			_aEBSPRINGER_2018
998			_b06/2019 _dz _ek _feng _ggw _h0
999			_c104020 _d104020 _x1