| 000 | 03308nam a22003975i 4500 | ||
|---|---|---|---|
| 999 |
_c103820 _d103820 _x1 |
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| 001 | 103820 | ||
| 003 | DE-He213 | ||
| 005 | 20230102113147.0 | ||
| 006 | a||||fo|||| 00| 0 | ||
| 007 | cr nn 008mamaa | ||
| 008 | 150212s2015 gw | s |||| 0|eng d | ||
| 020 | _a9783319118246 | ||
| 024 | 7 |
_a10.1007/978-3-319-11824-6 _2doi |
|
| 040 |
_bspa _dES-MaUEC |
||
| 050 | 4 |
_aTK7874 _b2015 EB |
|
| 100 | 1 |
_aTehranipoor, Mark (Mohammad). _eautor. _4aut _4http://id.loc.gov/vocabulary/relators/aut _1http://viaf.org/viaf/79225558/ |
|
| 245 | 1 | 0 |
_aCounterfeit Integrated Circuits _bDetection and Avoidance _cby Mark (Mohammad) Tehranipoor, Ujjwal Guin, Domenic Forte. |
| 264 | 1 |
_aCham _bSpringer International Publishing _c2015 |
|
| 300 | _a1 recurso en línea (XX, 269 páginas 134 ilustraciones, 109 ilustraciones a color.) | ||
| 336 |
_2rdacontent _aTexto (visual) _btxt |
||
| 337 |
_2rdamedia _aelectrónico _bc |
||
| 338 |
_2rdacarrier _arecurso electrónico _bcr |
||
| 490 | 0 | _aEngineering (Springer-11647) | |
| 505 | 0 | _aIntroduction -- Conterfeit Integrated Circuits -- Counterfeit Defects -- Physical Tests for Counterfeit Detection -- Electrical Tests for Counterfeit Detection -- Counterfeit Test Coverage: An Assessment of Current Counterfeit Detection Methods -- Advanced Detection: Physical Tests -- Advanced Detection: Electrical Tests -- Combating Die and IC Recycling -- Hardware IP Watermarking -- Prevention of Unlicensed and Rejected ICs from Untrusted Foundry and Assembly -- Chip ID. | |
| 520 | 3 | _aThis timely and exhaustive study offers a much-needed examination of the scope and consequences of the electronic counterfeit trade. The authors describe a variety of shortcomings and vulnerabilities in the electronic component supply chain, which can result in counterfeit integrated circuits (ICs). Not only does this book provide an assessment of the current counterfeiting problems facing both the public and private sectors, it also offers practical, real-world solutions for combatting this substantial threat. · Helps beginners and practitioners in the field by providing a comprehensive background on the counterfeiting problem; · Presents innovative taxonomies for counterfeit types, test methods, and counterfeit defects, which allows for a detailed analysis of counterfeiting and its mitigation; · Provides step-by-step solutions for detecting different types of counterfeit ICs; · Offers pragmatic and practice-oriented, realistic solutions to counterfeit IC detection and avoidance, for industry and government. | |
| 988 | _aEBSPRINGER_2018 | ||
| 650 | 7 |
_2embne _aCircuitos integrados _9139614 |
|
| 700 | 1 |
_aGuin, Ujjwal. _eautor. _4aut _4http://id.loc.gov/vocabulary/relators/aut _1http://viaf.org/viaf/315980871/ |
|
| 700 | 1 |
_aForte, Domenic. _eautor. _4aut _4http://id.loc.gov/vocabulary/relators/aut _1http://viaf.org/viaf/315980902/ |
|
| 776 | 0 | 8 |
_iEdición impresa: _z9783319118239 |
| 776 | 0 | 8 |
_iEdición impresa: _z9783319118253 |
| 776 | 0 | 8 |
_iEdición impresa: _z9783319364858 |
| 856 | 4 | 0 |
_uhttps://go.openathens.net/redirector/universidadeuropea.es?url=https://doi.org/10.1007/978-3-319-11824-6 _zAcceso a este recurso digital (usuarios Universidad Europea de Madrid) |
| 942 |
_2lcc _cLE |
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| 998 |
_b04/2019 _dz _eIG _zSI |
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