| 000 | 03585nam a22004095i 4500 | ||
|---|---|---|---|
| 999 |
_c103608 _d103608 _x1 |
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| 001 | 103608 | ||
| 003 | DE-He213 | ||
| 005 | 20230102113138.0 | ||
| 006 | a||||fo|||| 00| 0 | ||
| 007 | cr nn 008mamaa | ||
| 008 | 141105s2015 xxu| s |||| 0|eng d | ||
| 020 | _a9781461492665 | ||
| 024 | 7 |
_a10.1007/978-1-4614-9266-5 _2doi |
|
| 040 |
_bspa _dES-MaUEC |
||
| 050 | 4 |
_aTK7836 _b.L448 2015 EB |
|
| 100 | 1 |
_aLee, Tae-Kyu. _eautor. _4aut _4http://id.loc.gov/vocabulary/relators/aut _1http://viaf.org/viaf/103226455/ |
|
| 245 | 1 | 0 |
_aFundamentals of Lead-Free Solder Interconnect Technology _bFrom Microstructures to Reliability _cby Tae-Kyu Lee, Thomas R. Bieler, Choong-Un Kim, Hongtao Ma. |
| 264 | 1 |
_aBoston, MA _bSpringer International Publishing _c2015 |
|
| 300 | _a1 recurso en línea (XIII, 253 páginas 151 ilustraciones, 81 ilustraciones a color.) | ||
| 336 |
_2rdacontent _aTexto (visual) _btxt |
||
| 337 |
_2rdamedia _aelectrónico _bc |
||
| 338 |
_2rdacarrier _arecurso electrónico _bcr |
||
| 490 | 0 | _aEngineering (Springer-11647) | |
| 505 | 0 | _aIntroduction -- Interconnection : The Joint -- Phase Equilibria and Microstructure of Sn-Ag-Cu Alloys -- Microstructure Development; Solidification and Isothermal Aging -- Thermal Cycling Performance -- Mechanical Stability and Performance -- Chemical and Environment Attack -- Challenges in Future Generation Interconnects: Microstructure Again. | |
| 520 | 3 | _aThis unique book provides an up-to-date overview of the fundamental concepts behind lead-free solder and interconnection technology. Readers will find a description of the rapidly increasing presence of electronic systems in all aspects of modern life as well as the increasing need for predictable reliability in electronic systems. The physical and mechanical properties of lead-free solders are examined in detail, and building on fundamental science, the mechanisms responsible for damage and failure evolution, which affect reliability of lead-free solder joints are identified based on microstructure evolution. The continuing miniaturization of electronic systems will increase the demand on the performance of solder joints, which will require new alloy and processing strategies as well as interconnection design strategies. This book provides a foundation on which improved performance and new design approaches can be based. In summary, this book: Provides an up-to-date overview on lead-free soldering technologies Covers the fundamentals, implementation, reliability, challenges and risks of lead-free soldering technique Explores emerging technologies in lead-free soldering. | |
| 988 | _aEBSPRINGER_2018 | ||
| 650 | 7 |
_9140220 _aSoldadura |
|
| 700 | 1 |
_aBieler, Thomas R. _eautor. _4aut _4http://id.loc.gov/vocabulary/relators/aut _0http://id.loc.gov/authorities/names/n94102780 _1http://viaf.org/viaf/92379205/ |
|
| 700 | 1 |
_aKim, Choong-Un. _eautor. _4aut _4http://id.loc.gov/vocabulary/relators/aut _0http://id.loc.gov/authorities/names/no2011193963 _1http://viaf.org/viaf/186819139/ |
|
| 700 | 1 |
_aMa, Hongtao. _eautor. _4aut _4http://id.loc.gov/vocabulary/relators/aut _0http://id.loc.gov/authorities/names/nb2014013687 _1http://viaf.org/viaf/310520522/ |
|
| 776 | 0 | 8 |
_iEdición impresa: _z9781461492658 |
| 776 | 0 | 8 |
_iEdición impresa: _z9781461492672 |
| 776 | 0 | 8 |
_iEdición impresa: _z9781489978011 |
| 856 | 4 | 0 |
_uhttps://go.openathens.net/redirector/universidadeuropea.es?url=https://doi.org/10.1007/978-1-4614-9266-5 _zAcceso a este recurso digital (usuarios Universidad Europea de Madrid) |
| 942 |
_2lcc _cLE |
||
| 998 |
_b03/2019 _dz _eIG _zSI |
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