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| 005 | 20230102113123.0 | ||
| 007 | cr nn 008mamaa | ||
| 008 | 141203s2015 xxu| s |||| 0|eng d | ||
| 020 | _a9781493913497 | ||
| 024 | 7 |
_a10.1007/978-1-4939-1349-7 _2doi |
|
| 050 | 4 |
_aTK7874 _b.B487 2015 EB |
|
| 040 |
_aES-MaUEC _bspa |
||
| 100 | 1 |
_aBhushan, Manjul _eautor. _4aut _4http://id.loc.gov/vocabulary/relators/aut _0http://id.loc.gov/authorities/names/no2012031841 _1http://viaf.org/viaf/232574108/ |
|
| 245 | 1 | 0 |
_aCMOS Test and Evaluation _bA Physical Perspective _cby Manjul Bhushan, Mark B. Ketchen. |
| 264 | 1 |
_aNew York, NY _bSpringer International Publishing _c2015 |
|
| 300 | _a1 recurso en línea (XIII, 424 páginas 338 ilustraciones) | ||
| 505 | 0 | _aIntroduction -- CMOS Circuit Basics -- CMOS Storage Elements and Synchronous Logic -- IDDQ and Power -- Embedded PVT Monitors -- Variability -- Product Chip Test and Characterization -- Reliability, Burn-In and Guardbands -- Data Analysis and Characterization -- CMOS Metrics and Model Evaluation. | |
| 520 | 3 | _aThis book extends test structure applications described in Microelectronic Test Structures for CMOS Technology (Springer 2011) to digital CMOS product chips. Intended for engineering students and professionals, this book provides a single comprehensive source for evaluating CMOS technology and product test data from a basic knowledge of the physical behavior of the constituent components. Elementary circuits that exhibit key properties of complex CMOS chips are simulated and analyzed, and an integrated view of design, test and characterization is developed. Appropriately designed circuit monitors embedded in the CMOS chip serve to correlate CMOS technology models and circuit design tools to the hardware and also aid in test debug. Impact of silicon process variability, reliability, and power and performance sensitivities to a range of product application conditions are described. Circuit simulations exemplify the methodologies presented, and problems are included at the end of the chapters. | |
| 650 | 7 |
_aSistemas de seguridad _9 666757 _2embne |
|
| 700 | 1 |
_aKetchen, Mark B _eautor. _4aut _4http://id.loc.gov/vocabulary/relators/aut _0http://id.loc.gov/authorities/names/no2012031840 _1http://viaf.org/viaf/232541022/ |
|
| 776 | 0 | 8 |
_iEdición impresa: _z9781493913480 |
| 776 | 0 | 8 |
_iEdición impresa: _z9781493913503 |
| 776 | 0 | 8 |
_iEdición impresa: _z9781493947027 |
| 856 | 4 | 0 |
_uhttps://go.openathens.net/redirector/universidadeuropea.es?url=https://doi.org/10.1007/978-1-4939-1349-7 _zAcceso a este recurso digital (usuarios Universidad Europea de Madrid) |
| 490 | 0 | _aEngineering (Springer-11647) | |
| 998 |
_b03/2019 _dz _ef _feng _ggw _h0 |
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| 999 |
_c103284 _d103284 _x1 |
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