| 000 | 03141nam a22003255i 4500 | ||
|---|---|---|---|
| 001 | 103167 | ||
| 003 | DE-He213 | ||
| 005 | 20230102113118.0 | ||
| 007 | cr nn 008mamaa | ||
| 008 | 140915s2015 gw | s |||| 0|eng d | ||
| 020 | _a9783662444825 | ||
| 024 | 7 |
_a10.1007/978-3-662-44482-5 _2doi |
|
| 050 | 4 |
_aTK7874.654 _bG655 2015 EB |
|
| 040 |
_aES-MaUEC _bspa |
||
| 100 | 1 |
_aGoll, Bernhard _eautor. _4aut _4http://id.loc.gov/vocabulary/relators/aut _0http://id.loc.gov/authorities/names/nb2014024657 _1http://viaf.org/viaf/311466503/ |
|
| 245 | 1 | 0 |
_aComparators in Nanometer CMOS Technology _cby Bernhard Goll, Horst Zimmermann. |
| 264 | 1 |
_aBerlin, Heidelberg _bSpringer International Publishing _c2015 |
|
| 300 | _a1 recurso en línea (XIV, 250 páginas 217 ilustraciones, 37 ilustraciones a color.) | ||
| 490 | 0 |
_aSpringer Series in Advanced Microelectronics _x1437-0387 ; _v50 |
|
| 505 | 0 | _aFundamentals of clocked, regenerative comparators -- State-of-the-art nanometer CMOS -- Measurement circuits and setup -- Comparators in 120 nm CMOS -- Comparators in 65 nm CMOS -- Conclusions and comparison. | |
| 520 | 3 | _aThis book covers the complete spectrum of the fundamentals of clocked, regenerative comparators, their state-of-the-art, advanced CMOS technologies, innovative comparators inclusive circuit aspects, their characterization and properties. Starting from the basics of comparators and the transistor characteristics in nanometer CMOS, seven high-performance comparators developed by the authors in 120nm and 65nm CMOS are described extensively. Methods and measurement circuits for the characterization of advanced comparators are introduced. A synthesis of the largely differing aspects of demands on modern comparators and the properties of devices being available in nanometer CMOS, which are posed by the so-called nanometer hell of physics, is accomplished. The book summarizes the state of the art in integrated comparators. Advanced measurement circuits for characterization will be introduced as well as the method of characterization by bit-error analysis usually being used for characterization of optical receivers. The book is compact, and the graphical quality of the illustrations is outstanding. This book is written for engineers and researchers in industry as well as scientists and Ph.D students at universities. It is also recommendable to graduate students specializing on nanoelectronics and microelectronics or circuit design. | |
| 650 | 7 |
_aCircuitos integrados CMOS _2embne _9160755 |
|
| 700 | 1 |
_aZimmermann, Horst _eautor. _4aut _4http://id.loc.gov/vocabulary/relators/aut _0http://id.loc.gov/authorities/names/n78061974 _1http://viaf.org/viaf/116342077/ |
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| 776 | 0 | 8 |
_iEdición impresa: _z9783662444832 |
| 776 | 0 | 8 |
_iEdición impresa: _z9783662444818 |
| 776 | 0 | 8 |
_iEdición impresa: _z9783662520239 |
| 856 | 4 | 0 |
_uhttps://go.openathens.net/redirector/universidadeuropea.es?url=https://doi.org/10.1007/978-3-662-44482-5 _zAcceso a este recurso digital (usuarios Universidad Europea de Madrid) |
| 490 | 0 | _aEngineering (Springer-11647) | |
| 998 |
_b03/2019 _dz _ef _feng _ggw _h0 |
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| 999 |
_c103167 _d103167 _x1 |
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