| 000 | 02306nam a22003255i 4500 | ||
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| 001 | 102822 | ||
| 003 | DE-He213 | ||
| 005 | 20230102113101.0 | ||
| 007 | cr nn 008mamaa | ||
| 008 | 171024s2018 si | s |||| 0|eng d | ||
| 020 | _a9789811046124 | ||
| 024 | 7 |
_a10.1007/978-981-10-4612-4 _2doi |
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| 050 | 4 |
_aTK7871.96.B55 _bS869 2018 EB |
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| 100 | 1 |
_aSun, Yabin _eautor _4aut _4http://id.loc.gov/vocabulary/relators/aut _1http://viaf.org/viaf/348150264365405860006/ |
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| 245 | 1 | 0 |
_aResearch on the Radiation Effects and Compact Model of SiGe HBT _cby Yabin Sun. |
| 264 | 1 |
_aSingapore _bSpringer International Publishing _c2018 |
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| 300 | _a1 recurso en línea (XXIV, 168 páginas 171 ilustraciones) | ||
| 347 |
_atext file _bPDF |
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| 490 | 0 |
_aSpringer Theses, Recognizing Outstanding Ph.D. Research _x2190-5053 |
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| 505 | 0 | _aIntroduction -- Ionization damage in SiGe HBT -- Displacement damage with swift heavy ions in SiGe HBT -- Single-event transient induced by pulse laser microbeam in SiGe HBT -- Small-signal equivalent circuit of SiGe HBT based on the distributed effects -- Parameter extraction of SiGe HBT models -- Conclusion. | |
| 520 | 3 | _aThis book primarily focuses on the radiation effects and compact model of silicon-germanium (SiGe) heterojunction bipolar transistors (HBTs). It introduces the small-signal equivalent circuit of SiGe HBTs including the distributed effects, and proposes a novel direct analytical extraction technique based on non-linear rational function fitting. It also presents the total dose effects irradiated by gamma rays and heavy ions, as well as the single-event transient induced by pulse laser microbeams. It offers readers essential information on the irradiation effects technique and the SiGe HBTs model using that technique. | |
| 650 | 7 |
_aSemiconductores _2embne _9140004 |
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| 650 | 7 |
_aCircuitos de transistores _9141599 |
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| 776 | 0 | 8 |
_iEdición impresa: _z9789811046117 |
| 776 | 0 | 8 |
_iEdición impresa: _z9789811046131 |
| 856 | 4 | 0 |
_uhttps://go.openathens.net/redirector/universidadeuropea.es?url=https://doi.org/10.1007/978-981-10-4612-4 _zAcceso a este recurso digital (usuarios Universidad Europea de Madrid) |
| 490 | 0 | _aEngineering (Springer-11647) | |
| 988 | _aEBSPRINGER_2018 | ||
| 998 |
_b01/2019 _dz _ea _feng _ggw _h0 |
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| 999 |
_c102822 _d102822 _x1 |
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