000			02772nam a22004215i 4500
999			_c102526 _d102526
001			102526
003			DE-He213
005			20230102113046.0
006			a||||fo|||| 00| 0
007			cr nn 008mamaa
008			170623s2018 si | s |||| 0|eng d
020			_a9789811010736
024	7		_a10.1007/978-981-10-1073-6 _2doi
040			_bspa _cES-MaUEC _dES-MaUEC
050		4	_aTK7895.E42 _bW364 2018 EB
100	1		_aWang, Zheng. _eautor. _4aut _4http://id.loc.gov/vocabulary/relators/aut _0http://id.loc.gov/authorities/names/n82124700 _1http://viaf.org/viaf/99276871/
245	1	0	_aHigh-level Estimation and Exploration of Reliability for Multi-Processor System-on-Chip _cby Zheng Wang, Anupam Chattopadhyay.
264		1	_aSingapore _bSpringer International Publishing _c2018
300			_a1 recurso en línea (XX, 197 páginas 104 ilustraciones, 72 ilustraciones a color.)
336			_2rdacontent _aTexto _btxt
337			_2rdamedia _aelectrónico _bc
338			_2rdacarrier _arecurso electrónico _bcr
347			_atext file _bPDF
490	0		_aComputer Architecture and Design Methodologies, _x2367-3478
490	0		_aEngineering (Springer-11647)
505	0		_aIntroduction -- Background -- Related Work -- High-level Fault Injection and Simulation -- Architectural Reliability Estimation -- Architectural Reliability Exploration -- System-level Reliability Exploration -- Conclusion and Outlook.
520	3		_aThis book introduces a novel framework for accurately modeling the errors in nanoscale CMOS technology and developing a smooth tool flow at high-level design abstractions to estimate and mitigate the effects of errors. The book presents novel techniques for high-level fault simulation and reliability estimation as well as architecture-level and system-level fault tolerant designs. It also presents a survey of state-of-the-art problems and solutions, offering insights into reliability issues in digital design and their cross-layer countermeasures. .
988			_aEBSPRINGER_2018
650		7	_2embne _9153705 _aComponentes electrónicos
700	1		_aChattopadhyay, Anupam. _eautor. _4aut _4http://id.loc.gov/vocabulary/relators/aut _0http://id.loc.gov/authorities/names/nb2009003182 _1http://viaf.org/viaf/78889632/
710	2		_aSpringerLink (Online service) _0http://id.loc.gov/authorities/names/no2005046756 _1http://viaf.org/viaf/274647764/ _9106996
776	0	8	_iEdición impresa: _z9789811010729
776	0	8	_iEdición impresa: _z9789811010743
776	0	8	_iEdición impresa: _z9789811093210
856	4	0	_uhttps://go.openathens.net/redirector/universidadeuropea.es?url=https://doi.org/10.1007/978-981-10-1073-6 _zAcceso a este recurso digital (usuarios Universidad Europea de Madrid)
942			_2lcc _cLE