000			03326nam a2200433 i 4500
710	2		_aSpringerLink (Online service) _0http://id.loc.gov/authorities/names/no2005046756 _1http://viaf.org/viaf/274647764/ _9106996
999			_c102372 _d102372 _x1
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003			ES-MaUEC
005			20230102113038.0
006			a||||fo|||| 00| 0
007			cr nn 008mamaa
008			180426s2018 gw | s |||| 0|eng d
020			_a9783319786162
024	7		_a10.1007/978-3-319-78616-2 _2doi
040			_aES-MaUEC _bspa _cES-MaUEC _dES-MaUEC
050		4	_aTK7871.99.M44 _b2018 EB
100	1		_aPrinzie, Jeffrey _eautor. _4aut _4http://id.loc.gov/vocabulary/relators/aut _9673559
245	1	0	_aRadiation Hardened CMOS Integrated Circuits for Time-Based Signal Processing _cby Jeffrey Prinzie, Michiel Steyaert, Paul Leroux.
264		1	_aCham _bSpringer International Publishing _c2018
300			_a1 recurso en línea (XXV, 183 páginas) _b150 ilustraciones, 17 ilustraciones a color
336			_2rdacontent _aTexto _btxt
337			_2rdamedia _aelectrónico _bc
338			_2rdacarrier _arecurso electrónico _bcr
347			_atext file _bPDF
490	0		_aAnalog Circuits and Signal Processing _x1872-082X
490	0		_aEngineering (Springer-11647)
505	0		_aIntroduction -- Radiation Effects in CMOS Technology -- Time-Domain Signal Processing -- Clock Synthesizers -- Single Shot Time-to-Digital Converters -- Low Jitter Clock Generators -- Radiation experiments on CMOS PLLs -- Radiation Hard Frequency Synthesizers -- Conclusion.
520	3		_aThis book presents state-of-the-art techniques for radiation hardened high-resolution Time-to-Digital converters and low noise frequency synthesizers. Throughout the book, advanced degradation mechanisms and error sources are discussed and several ways to prevent such errors are presented. An overview of the prerequisite physics of nuclear interactions is given that has been compiled in an easy to understand chapter. The book is structured in a way that different hardening techniques and solutions are supported by theory and experimental data with their various tradeoffs. Based on leading-edge research, conducted in collaboration between KU Leuven and CERN, the European Center for Nuclear Research Describes in detail advanced techniques to harden circuits against ionizing radiation Provides a practical way to learn and understand radiation effects in time-based circuits Includes an introduction to the underlying physics, circuit design, and advanced techniques accompanied with experimental data.
988			_aEBSPRINGER_2018
650		7	_2embne _9673560 _aDispositivos MOS
650		7	_2embne _aIngeniería de sistemas _9138451
700			_aSteyaert, Michiel _eautor. _4aut _4http://id.loc.gov/vocabulary/relators/aut _1http://viaf.org/viaf/85538153/ _999027
700	1		_aLeroux, Paul _eautor. _4aut _4http://id.loc.gov/vocabulary/relators/aut _0http://id.loc.gov/authorities/names/n82277298 _1http://viaf.org/viaf/47964195/ _9673561
776	0	8	_iEdición impresa: _z9783319786155
776	0	8	_iEdición impresa: _z9783319786179
856	4	0	_uhttps://go.openathens.net/redirector/universidadeuropea.es?url=https://doi.org/10.1007/978-3-319-78616-2 _zAcceso a este recurso digital (usuarios Universidad Europea de Madrid)
942			_2lcc _cLE
998			_b05/2020 _dz _ek _zSI