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Transistores FET y MOS FET / Julio López Ramos

by López Ramos, Julio.

Material type: articlePrinted books Publisher: Madrid : Instituto Oficial de Radio Televisión Española, D.L. 1994Items
Location Call no. Status Vol info Loan type
Colección General (Campus Alcobendas) TK7871.95 .L67 1994 available

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Analytical Modelling of Breakdown Effect in Graphene Nanoribbon Field Effect Transistor / by Iraj Sadegh Amiri, Mahdiar Ghadiry.

by Amiri, Iraj Sadegh, (1977-), autor | Ghadiry, Mahdiar, autor.

Material type: bookE-book Publisher: Singapore : Springer International Publishing, 2018
Online access: Acceso a este recurso digital (usuarios Universidad Europea de Madrid)Digital Resources
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Location Call no. Status Vol info Loan type
Acceso Electrónico (UEM) TK7871.95 A457 2018 EB reference

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Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs / by Alexandra Zimpeck, Cristina Meinhardt, Laurent Artola, Ricardo Reis

by Zimpeck, Alexandra, autor | Meinhardt, Cristina, autor | Artola, Laurent, autor | Reis, Ricardo, autor.

Edition: First edition 2021Material type: bookE-book Publisher: Cham : Springer International Publishing, 2021
Online access: Acceso a este recurso digital (usuarios Universidad Europea de Madrid)Digital Resources
Items
Location Call no. Status Vol info Loan type
Acceso Electrónico (UEM) TK7871.95 2021 EB reference

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Compound Semiconductor Materials and Devices / by Zhaojun Liu, Tongde Huang, Qiang Li, Xing Lu, Xinbo Zou

by Liu, Zhaojun, (Electronics engineer), autor | Huang, Tongde, autor | Li, Q.(Qiang), (1943-), autor | Xing, Lu, autor | Zou, Xinbo, autor.

Edition: 1st edition 2016Material type: bookE-book Publisher: Cham : Springer International Publishing, 2016
Online access: Acceso a este recurso digital (usuarios Universidad Europea de Madrid)Digital Resources
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Location Call no. Status Vol info Loan type
Acceso Electrónico (UEM) TK7871.99.C65 2016 EB reference

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Low Substrate Temperature Modeling Outlook of Scaled n-MOSFET / by Nabil Shovon Ashraf

by Ashraf, Nabil Shovon, (1974-), autor.

Edition: 1st edition 2018Material type: bookE-book Publisher: Cham : Springer International Publishing, 2018
Online access: Acceso a este recurso digital (usuarios Universidad Europea de Madrid)Digital Resources
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Acceso Electrónico (UEM) TP482 2018 EB reference

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HF-Based High-K Dielectrics : Process Development, Performance Characterization, and Reliability / by Young-Hee Kim, Jack C. Lee

by Kim, Young-Hee, (1972-), autor | Lee, Jack C, autor.

Edition: 1st edition 2005Material type: bookE-book Publisher: Cham : Springer International Publishing, 2005
Online access: Acceso a este recurso digital (usuarios Universidad Europea de Madrid)Digital Resources
Items
Location Call no. Status Vol info Loan type
Acceso Electrónico (UEM) QC585 2005 EB reference

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RF and Time-domain Techniques for Evaluating Novel Semiconductor Transistors / by Keith A. Jenkins

by Jenkins, Keith A, (1953-), autor.

Edition: 1st edition 2022Material type: bookE-book Publisher: Cham : Springer International Publishing, 2022
Online access: Acceso a este recurso digital (usuarios Universidad Europea de Madrid)Digital Resources
Items
Location Call no. Status Vol info Loan type
Acceso Electrónico (UEM) TK7871.95 2022 EB reference

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Advanced SPICE Model for GaN HEMTs (ASM-HEMT) : A New Industry-Standard Compact Model for GaN-based Power and RF Circuit Design / by Sourabh Khandelwal

by Khandelwal, Sourabh, autor.

Edition: 1st edition 2022Material type: bookE-book Publisher: Cham : Springer International Publishing, 2022
Online access: Acceso a este recurso digital (usuarios Universidad Europea de Madrid)Digital Resources
Items
Location Call no. Status Vol info Loan type
Acceso Electrónico (UEM) TK7871.95 2022 EB reference

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