EM Material Characterization Techniques for Metamaterials / by Raveendranath U. Nair, Maumita Dutta, Mohammed Yazeen P.S., K. S. Venu.
By: Nair, Raveendranath U, autor
Contributor(s): Dutta, Maumita, autor | P.S., Mohammed Yazeen, autor | Venu, K. S, autor
Material type:
E-bookSeries: (SpringerBriefs in Computational Electromagnetics, 2365-6239); (Engineering (Springer-11647)).Publisher: Singapore : Springer International Publishing, 2018Description: 1 recurso en línea (XXIII, 50 páginas 18 ilustraciones, 12 ilustraciones a color).ISBN: 9789811065170.Subject: Metamateriales
| MicroondasOnline resources: Acceso a este recurso digital (usuarios Universidad Europea de Madrid)
Abstract: This book presents a review of techniques based on waveguide systems, striplines, freespace systems and more, discussing the salient features of each method in detail. Since metamaterials are typically inhomogeneous and anisotropic, the experimental techniques for electromagnetic (EM) material characterization of metamaterial structures need to tackle several challenges. Furthermore, the modes supported by metamaterial structures are extremely sensitive to external perturbations. As such the measurement fixtures for EM material characterization have to be modified to account for such effects. The book provides a valuable resource for researchers working in the field of metamaterials .
| Item type | Current library | Collection | Call number | Status | Date due | Barcode | Item holds | |
|---|---|---|---|---|---|---|---|---|
LIBRO-E NO PRÉSTAMO
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Madrid Digital Acceso Electrónico (UEM) | Ciencias e Ingeniería | TK7871.15.M48 N357 2018 EB (Browse shelf(Opens below)) | Acceso electrónico | eBook.15112892 |
This book presents a review of techniques based on waveguide systems, striplines, freespace systems and more, discussing the salient features of each method in detail. Since metamaterials are typically inhomogeneous and anisotropic, the experimental techniques for electromagnetic (EM) material characterization of metamaterial structures need to tackle several challenges. Furthermore, the modes supported by metamaterial structures are extremely sensitive to external perturbations. As such the measurement fixtures for EM material characterization have to be modified to account for such effects. The book provides a valuable resource for researchers working in the field of metamaterials .
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