Biblioteca CRAI Dulce Chacón - Universidad Europea de Madrid

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Hot Carrier Degradation in Semiconductor Devices / edited by Tibor Grasser.

by Grasser, Tibor, editor literario.

Material type: bookE-book Publisher: Cham : Springer International Publishing, 2015
Online access: Acceso a este recurso digital (usuarios Universidad Europea de Madrid)Digital Resources
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Location Call no. Status Vol info Loan type
Acceso Electrónico (UEM) QC611.6 .H67 H683 2015 EB reference

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Noise in Nanoscale Semiconductor Devices / / edited by Tibor Grasser

by Grasser, Tibor, editor | SpringerLink (Online service).

Edition: First editionMaterial type: bookE-book Publisher: Cham : Springer International Publishing : Imprint: Springer, 2020
Online access: Acceso a este recurso digital (usuarios Universidad Europea de Madrid)Digital Resources
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Location Call no. Status Vol info Loan type
Acceso Electrónico (UEM) TK7871.85 2020 EB reference

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