Biblioteca CRAI Dulce Chacón - Universidad Europea de Madrid

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Post-Silicon Validation and Debug / edited by Prabhat Mishra, Farimah Farahmandi

by SpringerLink (Online service) | Farahmandi, Farimah, editor literario | Mishra, Prabhat, editor literario.

Material type: bookE-book Publisher: Cham : Springer International Publishing ; Imprint: Springer, 2019
Online access: Acceso a este recurso digital (usuarios Universidad Europea de Madrid)Digital Resources
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Acceso Electrónico (UEM) QA76.9 .D43 2019 EB reference

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Essential spectrum-based fault localization / by Xiaoyuan Xie, Baowen Xu

by Xie, Xiaoyuan, autor | Xu, Baowen, autor | SpringerLink.

Edition: First edition 2021Material type: bookE-book Publisher: Singapore : Springer International Publising, 2021
Online access: Acceso a este recurso digital (usuarios Universidad Europea de Madrid)Digital Resources
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Acceso Electrónico (UEM) QA76.9 .D43 2021 EB reference

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Design for Testability, Debug and Reliability : Next Generation Measures Using Formal Techniques / by Sebastian Huhn, Rolf Drechsler

by Huhn, Sebastian, (1974-), autor | Drechsler, Rolf, autor.

Edition: First edition 2021Material type: bookE-book Publisher: Cham : Springer International Publishing, 2021
Online access: Acceso a este recurso digital (usuarios Universidad Europea de Madrid)Digital Resources
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Acceso Electrónico (UEM) TK7874 2021 EB reference

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Tests and Proofs : 16th International Conference, TAP 2022, Held as Part of STAF 2022, Nantes, France, July 5, 2022, Proceedings / edited by Laura Kovács, Karl Meinke

by Kovács, Laura, editor literario | Meinke, Karl, editor literario.

Edition: First edition 2022Material type: bookE-book Publisher: Cham : Springer International Publising, 2022
Online access: Acceso a este recurso digital (usuarios Universidad Europea de Madrid)Digital Resources
Items
Location Call no. Status Vol info Loan type
Acceso Electrónico (UEM) QA76.758 2022 EB reference

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