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Optical Interconnects / by Ray T. Chen, Chulchae Choi
by Chen, Ray T, autor | Choi, Chulchae, autor. Edition: 1st edition 2008Material type:  E-book Publisher: Cham : Springer International Publishing, 2008Items
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Call no. |
Status |
Vol info |
Loan type |
| Acceso Electrónico (UEM) |
TA1660 2008 EB |
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An Introduction to Logic Circuit Testing / by Parag K. Lala
by Lala, Parag K, (1948-), autor. Edition: 1st edition 2009Material type: E-book Publisher: Cham : Springer International Publishing, 2009Items
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Call no. |
Status |
Vol info |
Loan type |
| Acceso Electrónico (UEM) |
TK7868.L6 2009 EB |
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On-Chip Photonic Interconnects : A Computer Architect's Perspective / by Christopher J. Nitta, Matthew Farrens, Venkatesh Akella
by Nitta, Christopher J, autor | Farrens, Matthew K, autor | Akella, Venkatesh, (1982-), autor. Edition: 1st edition 2014Material type: E-book Publisher: Cham : Springer International Publishing, 2014Items
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Call no. |
Status |
Vol info |
Loan type |
| Acceso Electrónico (UEM) |
TK7874.53 2014 EB |
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New Prospects of Integrating Low Substrate Temperatures with Scaling-Sustained Device Architectural Innovation / by Nabil Shovon Ashraf, Shawon Alam, Mohaiminul Alam
by Ashraf, Nabil Shovon, (1974-), autor | Alam, Shawon, autor | Alam, Mohaiminul, autor. Edition: 1st edition 2016Material type: E-book Publisher: Cham : Springer International Publishing, 2016Items
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Call no. |
Status |
Vol info |
Loan type |
| Acceso Electrónico (UEM) |
TK7874.75 2016 EB |
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Layout Techniques in MOSFETs / by Salvador Pinillos Gimenez
by Gimenez, Salvador Pinillos, (1962-), autor. Edition: 1st edition 2016Material type: E-book Publisher: Cham : Springer International Publishing, 2016Items
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Call no. |
Status |
Vol info |
Loan type |
| Acceso Electrónico (UEM) |
TK7871.95 2016 EB |
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Design and Analysis of Multi-Band Filtering Circuits / by Xiaojun Bi, Qiang Ma, Zilan Cao, Qinfen Xu
by Bi, Xiaojun, autor | Ma, Qiang, autor | Cao, Zilan, autor | Xu, Qinfen, autor. Edition: 1st edition 2022Material type: E-book Publisher: Singapore : Springer International Publishing, 2022Items
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Status |
Vol info |
Loan type |
| Acceso Electrónico (UEM) |
TK7872.F5 2022 EB |
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Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design : A Self-Test, Self-Diagnosis, and Self-Repair-Based Approach / by Xiaowei Li, Guihai Yan, Cheng Liu
by Li, Xiaowei, (1964-), autor | Yan, Guihai, autor | Liu, Cheng, autor. Edition: 1st ed 2023Material type: E-book Publisher: Singapore : Springer Nature , 2023Items
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Call no. |
Status |
Vol info |
Loan type |
| Acceso Electrónico (UEM) |
TK7874 2023 EB |
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