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Pattern Recognition. ICPR International Workshops and Challenges : Virtual Event, January 10-15, 2021, Proceedings, Part VIII / edited by Alberto Del Bimbo, Rita Cucchiara, Stan Sclaroff, Giovanni Maria Farinella, Tao Mei, Marco Bertini, Hugo Jair Escalante, Roberto Vezzani
by Del Bimbo, Alberto, editor literario | Cucchiara, Rita, editor literario | Sclaroff, Stan, editor literario | Farinella, Giovanni Maria, editor literario | Mei, Tao, editor literario | Bertini, Marco, editor literario | Escalante, Hugo Jair, editor literario | Vezzani, Roberto, editor literario | SpringerLink. Edition: First edition 2021Material type:  E-book Publisher: Cham, Switzerland : Springer International Publising, 2021Items
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| Acceso Electrónico (UEM) |
TA1634 2021 EB |
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Pattern Recognition. ICPR International Workshops and Challenges : Virtual Event, January 10-15, 2021, Proceedings, Part III / edited by Alberto Del Bimbo, Rita Cucchiara, Stan Sclaroff, Giovanni Maria Farinella, Tao Mei, Marco Bertini, Hugo Jair Escalante, Roberto Vezzani
by Del Bimbo, Alberto, editor literario | Cucchiara, Rita, editor literario | Sclaroff, Stan, editor literario | Farinella, Giovanni Maria, editor literario | Mei, Tao, editor literario | Bertini, Marco, editor literario | Escalante, Hugo Jair, editor literario | Vezzani, Roberto, editor literario | SpringerLink. Edition: First edition 2021Material type: E-book Publisher: Cham, Switzerland : Springer International Publising, 2021Items
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TA1634 2021 EB |
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Pattern Recognition. ICPR International Workshops and Challenges : Virtual Event, January 10-15, 2021, Proceedings, Part V / edited by Alberto Del Bimbo, Rita Cucchiara, Stan Sclaroff, Giovanni Maria Farinella, Tao Mei, Marco Bertini, Hugo Jair Escalante, Roberto Vezzani
by Del Bimbo, Alberto, editor literario | Cucchiara, Rita, editor literario | Sclaroff, Stan, editor literario | Farinella, Giovanni Maria, editor literario | Mei, Tao, editor literario | Bertini, Marco, editor literario | Escalante, Hugo Jair, editor literario | Vezzani, Roberto, editor literario | SpringerLink. Edition: First edition 2021Material type: E-book Publisher: Cham, Switzerland : Springer International Publising, 2021Items
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TA1634 2021 EB |
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Pattern Recognition : 43rd DAGM German Conference, DAGM GCPR 2021, Bonn, Germany, September 28 - October 1, 2021, Proceedings / edited by Christian Bauckhage, Juergen Gall, Alexander Schwing
by Bauckhage, Christian, editor literario | Gall, Juergen, editor literario | Schwing, Alexander, editor literario. Edition: First edition 2021Source: Springer Nature eBookMaterial type: E-book Publisher: Cham : Springer International Publising, 2021Items
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TK7882 .P3 2021 EB |
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Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications : 25th Iberoamerican Congress, CIARP 2021, Porto, Portugal, May 10-13, 2021, Revised Selected Papers / edited by João Manuel R. S. Tavares, João Paulo Papa, Manuel González Hidalgo
by Tavares, João Manuel R. S, editor literario | Papa, João Paulo, editor literario | González Hidalgo, Manuel, editor literario. Edition: First edition 2021Source: Springer Nature eBookMaterial type: E-book Publisher: Cham : Springer International Publising, 2021Items
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TK7882 .P3 2021 EB |
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Computational Intelligence in Pattern Recognition : Proceedings of CIPR 2022 / edited by Asit Kumar Das, Janmenjoy Nayak, Bighnaraj Naik, S. Vimal, Danilo Pelusi
by Das, Asit Kumar, editor literario | Nayak, Janmenjoy, editor literario | Naik, Bighnaraj, editor literario | Vimal, S, editor literario | Pelusi, Danilo, editor literario. Edition: First edition 2022Source: Springer Nature eBookMaterial type: E-book Publisher: Singapore : Springer International Publishing, 2022Items
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| Acceso Electrónico (UEM) |
Q342 2022 EB |
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Sensor- and Video-Based Activity and Behavior Computing : Proceedings of 3rd International Conference on Activity and Behavior Computing (ABC 2021) / edited by Md Atiqur Rahman Ahad, Sozo Inoue, Daniel Roggen, Kaori Fujinami
by Ahad, Md Atiqur Rahman, editor literario | Inoue, Sozo, editor literario | Roggen, Daniel, editor literario | Fujinami, Kaori, editor literario. Edition: First edition 2022Source: Springer Nature eBookMaterial type: E-book Publisher: Singapore : Springer International Publishing, 2022Items
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TK7882.P3 2022 EB |
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Recent Trends in Image Processing and Pattern Recognition : 4th International Conference, RTIP2R 2021, Msida, Malta, December 8-10, 2021, Revised Selected Papers / edited by KC Santosh, Ravindra Hegadi, Umapada Pal
by Santosh, K. C, editor literario | Hegadi, Ravindra, editor literario | Pal, Umapada, editor literario. Edition: First edition 2022Material type: E-book Publisher: Cham : Springer International Publising, 2022Items
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TA1634 2022 EB |
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Pattern Recognition and Artificial Intelligence : Third International Conference, ICPRAI 2022, Paris, France, June 1-3, 2022, Proceedings, Part II / edited by Mounîm El Yacoubi, Eric Granger, Pong Chi Yuen, Umapada Pal, Nicole Vincent
by El Yacoubi, Mounîm, editor literario | Granger, Eric, editor literario | Yuen, Pong Chi, editor literario | Pal, Umapada, editor literario | Vincent, Nicole, editor literario. Edition: First edition 2022Material type: E-book Publisher: Cham : Springer International Publising, 2022Items
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| Acceso Electrónico (UEM) |
Q334 2022 EB |
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Pattern Recognition and Artificial Intelligence : Third International Conference, ICPRAI 2022, Paris, France, June 1-3, 2022, Proceedings, Part I / edited by Mounîm El Yacoubi, Eric Granger, Pong Chi Yuen, Umapada Pal, Nicole Vincent
by El Yacoubi, Mounîm, editor literario | Granger, Eric, editor literario | Yuen, Pong Chi, editor literario | Pal, Umapada, editor literario | Vincent, Nicole, editor literario. Edition: First edition 2022Material type: E-book Publisher: Cham : Springer International Publising, 2022Items
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| Acceso Electrónico (UEM) |
Q334 2022 EB |
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Pattern Recognition : 14th Mexican Conference, MCPR 2022, Ciudad Juárez, Mexico, June 22-25, 2022, Proceedings / edited by Osslan Osiris Vergara-Villegas, Vianey Guadalupe Cruz-Sánchez, Juan Humberto Sossa-Azuela, Jesús Ariel Carrasco-Ochoa, José Francisco Martínez-Trinidad, José Arturo Olvera-López
by Vergara-Villegas, Osslan Osiris, editor literario | Cruz-Sánchez, Vianey Guadalupe, editor literario | Sossa-Azuela, Juan Humberto, editor literario | Carrasco-Ochoa, Jesús Ariel, editor literario | Martínez-Trinidad, José Francisco, editor literario | Olvera-López, José Arturo, editor literario. Edition: First edition 2022Material type: E-book Publisher: Cham : Springer International Publising, 2022Items
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| Acceso Electrónico (UEM) |
TK7882.P3 2022 EB |
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Pattern Recognition and Information Processing : 15th International Conference, PRIP 2021, Minsk, Belarus, September 21-24, 2021, Revised Selected Papers / edited by Alexander V. Tuzikov, Alexei M. Belotserkovsky, Marina M. Lukashevich
by Tuzikov, Alexander V, editor literario | Belotserkovsky, Alexei M, editor literario | Lukashevich, Marina M, editor literario. Edition: First edition 2022Material type: E-book Publisher: Cham : Springer International Publising, 2022Items
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TK7882.P3 2022 EB |
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Document Analysis Systems : 15th IAPR International Workshop, DAS 2022, La Rochelle, France, May 22-25, 2022, Proceedings / edited by Seiichi Uchida, Elisa Barney, Véronique Eglin
by Uchida, Seiichi, editor literario | Barney, Elisa, editor literario | Eglin, Véronique, editor literario. Edition: First edition 2022Material type: E-book Publisher: Cham : Springer International Publising, 2022Items
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| Acceso Electrónico (UEM) |
TA1650 2022 EB |
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Intelligent Systems and Pattern Recognition : Second International Conference, ISPR 2022, Hammamet, Tunisia, March 24-26, 2022, Revised Selected Papers / edited by Akram Bennour, Tolga Ensari, Yousri Kessentini, Sean Eom
by Bennour, Akram, editor literario | Ensari, Tolga, editor literario | Kessentini, Yousri, editor literario | Eom, Sean, editor literario. Edition: First edition 2022Material type: E-book Publisher: Cham : Springer International Publising, 2022Other title: Intelligent Systems and Pattern Recognition : 2nd International Conference, ISPR 2022, Hammamet, Tunisia, March 24-26, 2022, Revised Selected Papers.Items
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| Acceso Electrónico (UEM) |
Q334 2022 EB |
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Advances in Intelligent Data Analysis XX : 20th International Symposium on Intelligent Data Analysis, IDA 2022, Rennes, France, April 20-22, 2022, Proceedings / edited by Tassadit Bouadi, Elisa Fromont, Eyke Hüllermeier
by Bouadi, Tassadit, editor literario | Fromont, Elisa, editor literario | Hüllermeier, Eyke, editor literario. Edition: First edition 2022Material type: E-book Publisher: Cham : Springer International Publising, 2022Items
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Q337.5 2022 EB |
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Pattern Recognition and Artificial Intelligence : 5th Mediterranean Conference, MedPRAI 2021, Istanbul, Turkey, December 17-18, 2021, Proceedings / edited by Chawki Djeddi, Imran Siddiqi, Akhtar Jamil, Alaa Ali Hameed, İsmail Kucuk
by Djeddi, Chawki, editor literario | Siddiqi, Imran, editor literario | Jamil, Akhtar, editor literario | Ali Hameed, Alaa, editor literario | Kucuk, İsmail, editor literario. Edition: First edition 2022Material type: E-book Publisher: Cham : Springer International Publising, 2022Items
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TK7882.P3 2022 EB |
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Pattern Recognition and Image Analysis : 10th Iberian Conference, IbPRIA 2022, Aveiro, Portugal, May 4-6, 2022, Proceedings / edited by Armando J. Pinho, Petia Georgieva, Luís F. Teixeira, Joan Andreu Sánchez
by Pinho, Armando J, editor literario | Georgieva, Petia, editor literario | Teixeira, Luís F, editor literario | Sánchez, Joan Andreu, editor literario. Edition: First edition 2022Material type: E-book Publisher: Cham : Springer International Publising, 2022Items
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| Acceso Electrónico (UEM) |
TA1650 2022 EB |
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Pattern Recognition : 6th Asian Conference, ACPR 2021, Jeju Island, South Korea, November 9-12, 2021, Revised Selected Papers, Part II / edited by Christian Wallraven, Qingshan Liu, Hajime Nagahara
by Wallraven, Christian, editor literario | Liu, Qingshan, editor literario | Nagahara, Hajime, editor literario. Edition: First edition 2022Material type: E-book Publisher: Cham : Springer International Publising, 2022Items
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TK7882.P3 2022 EB |
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Pattern Recognition : 6th Asian Conference, ACPR 2021, Jeju Island, South Korea, November 9-12, 2021, Revised Selected Papers, Part I / edited by Christian Wallraven, Qingshan Liu, Hajime Nagahara
by Wallraven, Christian, editor literario | Liu, Qingshan, editor literario | Nagahara, Hajime, editor literario. Edition: First edition 2022Material type: E-book Publisher: Cham : Springer International Publising, 2022Items
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TK7882.P3 2022 EB |
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Visual Object Recognition / by Kristen Grauman, Bastian Leibe
by Grauman, Kristen Lorraine, (1979-), autor | Leibe, Bastian, autor. Edition: 1st edition 2011Material type: E-book Publisher: Cham : Springer International Publishing, 2011Items
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TA1634 2011 EB |
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