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Proceedings of the 11th International Conference on Robotics, Vision, Signal Processing and Power Applications : Enhancing Research and Innovation through the Fourth Industrial Revolution / edited by Nor Muzlifah Mahyuddin, Nor Rizuan Mat Noor, Harsa Amylia Mat Sakim
by Mahyuddin, Nor Muzlifah, editor literario | Mat Noor, Nor Rizuan, editor literario | Mat Sakim, Harsa Amylia, editor literario. Edition: First edition 2022Material type:  E-book Publisher: Singapore : Springer International Publishing, 2022Items
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| Acceso Electrónico (UEM) |
TJ210.3 2022 EB |
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Proceedings of the International Conference on Intelligent Vision and Computing (ICIVC 2021) / edited by Harish Sharma, Vijay Kumar Vyas, Rajesh Kumar Pandey, Mukesh Prasad
by Sharma, Harish, editor literario | Vyas, Vijay Kumar, editor literario | Pandey, Rajesh Kumar, editor literario | Prasad, Mukesh, editor literario. Edition: First edition 2022Source: Springer Nature eBookMaterial type: E-book Publisher: Cham : Springer International Publishing, 2022Items
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| Acceso Electrónico (UEM) |
TA1634 2022 EB |
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Innovations in Computational Intelligence and Computer Vision : Proceedings of ICICV 2021 / edited by Satyabrata Roy, Deepak Sinwar, Thinagaran Perumal, Adam Slowik, João Manuel R. S. Tavares
by Roy, Satyabrata, editor literario | Sinwar, Deepak, editor literario | Perumal, Thinagaran, editor literario | Slowik, Adam, editor literario | Tavares, João Manuel R. S, editor literario. Edition: First edition 2022Source: Springer Nature eBookMaterial type: E-book Publisher: Singapore : Springer International Publishing, 2022Items
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| Acceso Electrónico (UEM) |
Q342 2022 EB |
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Recent Trends in Image Processing and Pattern Recognition : 4th International Conference, RTIP2R 2021, Msida, Malta, December 8-10, 2021, Revised Selected Papers / edited by KC Santosh, Ravindra Hegadi, Umapada Pal
by Santosh, K. C, editor literario | Hegadi, Ravindra, editor literario | Pal, Umapada, editor literario. Edition: First edition 2022Material type: E-book Publisher: Cham : Springer International Publising, 2022Items
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| Acceso Electrónico (UEM) |
TA1634 2022 EB |
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Pattern Recognition : 14th Mexican Conference, MCPR 2022, Ciudad Juárez, Mexico, June 22-25, 2022, Proceedings / edited by Osslan Osiris Vergara-Villegas, Vianey Guadalupe Cruz-Sánchez, Juan Humberto Sossa-Azuela, Jesús Ariel Carrasco-Ochoa, José Francisco Martínez-Trinidad, José Arturo Olvera-López
by Vergara-Villegas, Osslan Osiris, editor literario | Cruz-Sánchez, Vianey Guadalupe, editor literario | Sossa-Azuela, Juan Humberto, editor literario | Carrasco-Ochoa, Jesús Ariel, editor literario | Martínez-Trinidad, José Francisco, editor literario | Olvera-López, José Arturo, editor literario. Edition: First edition 2022Material type: E-book Publisher: Cham : Springer International Publising, 2022Items
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Call no. |
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Vol info |
Loan type |
| Acceso Electrónico (UEM) |
TK7882.P3 2022 EB |
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Frontiers of Computer Vision : 28th International Workshop, IW-FCV 2022, Hiroshima, Japan, February 21-22, 2022, Revised Selected Papers / edited by Kazuhiko Sumi, In Seop Na, Naoshi Kaneko
by Sumi, Kazuhiko, editor literario | Na, In Seop, editor literario | Kaneko, Naoshi, editor literario. Edition: First edition 2022Material type: E-book Publisher: Cham : Springer International Publising, 2022Items
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| Acceso Electrónico (UEM) |
TA1634 2022 EB |
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High Performance Computing and Networking : Select Proceedings of CHSN 2021 / edited by Ch. Satyanarayana, Debasis Samanta, Xiao-Zhi Gao, Rajiv Kumar Kapoor
by Satyanarayana, Ch, editor literario | Samanta, Debasis, editor literario | Gao, Xiao-Zhi, editor literario | Kapoor, Rajiv Kumar, editor literario. Edition: First edition 2022Material type: E-book Publisher: Singapore : Springer International Publising, 2022Items
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| Acceso Electrónico (UEM) |
QA76.88 2022 EB |
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Bio-Inspired Computing: Theories and Applications : 16th International Conference, BIC-TA 2021, Taiyuan, China, December 17-19, 2021, Revised Selected Papers, Part I / edited by Linqiang Pan, Zhihua Cui, Jianghui Cai, Lianghao Li
by Pan, Linqiang, editor literario | Cui, Zhihua, editor literario | Cai, Jianghui, editor literario | Li, Lianghao, editor literario. Edition: First edition 2022Material type: E-book Publisher: Singapore : Springer International Publising, 2022Items
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| Acceso Electrónico (UEM) |
Q335 2022 EB |
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Pattern Recognition and Image Analysis : 10th Iberian Conference, IbPRIA 2022, Aveiro, Portugal, May 4-6, 2022, Proceedings / edited by Armando J. Pinho, Petia Georgieva, Luís F. Teixeira, Joan Andreu Sánchez
by Pinho, Armando J, editor literario | Georgieva, Petia, editor literario | Teixeira, Luís F, editor literario | Sánchez, Joan Andreu, editor literario. Edition: First edition 2022Material type: E-book Publisher: Cham : Springer International Publising, 2022Items
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Vol info |
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| Acceso Electrónico (UEM) |
TA1650 2022 EB |
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Deep Learning to See : Towards New Foundations of Computer Vision / by Alessandro Betti, Marco Gori, Stefano Melacci
by Betti, Alessandro, (1977-), autor | Gori, Marco, autor | Melacci, Stefano, autor. Edition: First edition 2022Material type: E-book Publisher: Cham : Springer International Publising, 2022Items
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Call no. |
Status |
Vol info |
Loan type |
| Acceso Electrónico (UEM) |
TA1634 2022 EB |
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Pattern Recognition : 6th Asian Conference, ACPR 2021, Jeju Island, South Korea, November 9-12, 2021, Revised Selected Papers, Part II / edited by Christian Wallraven, Qingshan Liu, Hajime Nagahara
by Wallraven, Christian, editor literario | Liu, Qingshan, editor literario | Nagahara, Hajime, editor literario. Edition: First edition 2022Material type: E-book Publisher: Cham : Springer International Publising, 2022Items
| Location |
Call no. |
Status |
Vol info |
Loan type |
| Acceso Electrónico (UEM) |
TK7882.P3 2022 EB |
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Pattern Recognition : 6th Asian Conference, ACPR 2021, Jeju Island, South Korea, November 9-12, 2021, Revised Selected Papers, Part I / edited by Christian Wallraven, Qingshan Liu, Hajime Nagahara
by Wallraven, Christian, editor literario | Liu, Qingshan, editor literario | Nagahara, Hajime, editor literario. Edition: First edition 2022Material type: E-book Publisher: Cham : Springer International Publising, 2022Items
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Call no. |
Status |
Vol info |
Loan type |
| Acceso Electrónico (UEM) |
TK7882.P3 2022 EB |
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Computer Vision, Imaging and Computer Graphics Theory and Applications : 16th International Joint Conference, VISIGRAPP 2021, Virtual Event, February 8-10, 2021, Revised Selected Papers / edited by A. Augusto de Sousa, Vlastimil Havran, Alexis Paljic, Tabitha Peck, Christophe Hurter, Helen Purchase, Giovanni Maria Farinella, Petia Radeva, Kadi Bouatouch Edition: 1st ed 2023Material type: E-book Publisher: Cham : Springer International Publishing , 2023Items
| Location |
Call no. |
Status |
Vol info |
Loan type |
| Acceso Electrónico (UEM) |
TA1634 2023 EB |
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Computer Vision and Image Processing : 7th International Conference, CVIP 2022, Nagpur, India, November 4-6, 2022, Revised Selected Papers . Part I / edited by Deep Gupta, Kishor Bhurchandi, Subrahmanyam Murala, Balasubramanian Raman, Sanjeev Kumar Edition: 1st ed 2023Material type: E-book Publisher: Cham : Springer Nature Switzerland , 2023Items
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Call no. |
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Vol info |
Loan type |
| Acceso Electrónico (UEM) |
TA1634 2023 EB |
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Computer Vision and Image Processing : 7th International Conference, CVIP 2022, Nagpur, India, November 4-6, 2022, Revised Selected Papers . Part II / edited by Deep Gupta, Kishor Bhurchandi, Subrahmanyam Murala, Balasubramanian Raman, Sanjeev Kumar Edition: 1st ed 2023Material type: E-book Publisher: Cham : Springer Nature Switzerland , 2023Items
| Location |
Call no. |
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Vol info |
Loan type |
| Acceso Electrónico (UEM) |
TA1634 2023 EB |
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Recent Trends in Image Processing and Pattern Recognition : 5th International Conference, RTIP2R 2022, Kingsville, TX, USA, December 1-2, 2022, Revised Selected Papers / edited by K. C. Santosh, Ayush Goyal, Djamila Aouada, Aaisha Makkar, Yao-Yi Chiang, Satish K. Singh Edition: 1st ed 2023Material type: E-book Publisher: Cham : Springer Nature Switzerland , 2023Items
| Location |
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Vol info |
Loan type |
| Acceso Electrónico (UEM) |
TA1634 2023 EB |
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