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Reliability engineering : theory and practice / Alessandro Birolini.

By: Birolini, Alessandro,, (1940-), autor
Material type: materialTypeLabelE-bookPublisher: Berlin, Germany : Springer, 2017Edition: 8th edition.Description: 1 recurso en línea.ISBN: 3662542080; 3662542099; 9783662542088; 9783662542095.Subject: Fiabilidad (Ingeniería)Online resources: Acceso a este recurso digital (usuarios Universidad Europea de Madrid)Digital Resources
Contents:
Preface to the 8 th Edition; Contents; 1 Basic Concepts, Quality & Reliability (RAMS) Assurance of Complex Equipment & Systems; 1.1 Introduction; 1.2 Basic Concepts; 1.2.1 Reliability; 1.2.2 Failure; 1.2.3 Failure Rate, MTTF, MTBF; 1.2.4 Maintenance, Maintainability; 1.2.5 Logistic Support; 1.2.6 Availability; 1.2.7 Safety, Risk, Risk Acceptance; 1.2.8 Quality; 1.2.9 Cost and System Effectiveness; 1.2.10 Product Liability; 1.2.11 Historical Development; 1.3 Basic Tasks & Rules for Quality and Reliability (RAMS) Assurance of Complex Equip. & Systems
1.3.1 Quality and Reliability (RAMS) Assurance Tasks1.3.2 Basic Quality and Reliability (RAMS) Assurance Rules; 1.3.3 Elements of a Quality Assurance System; 1.3.4 Motivation and Training; 2 Reliability Analysis During the Design Phase; 2.1 Introduction; 2.2 Predicted Reliability of Equipment and Systems with Simple Structure; 2.2.1 Required Function; 2.2.2 Reliability Block Diagram; 2.2.3 Operating Conditions at Component Level, Stress Factors; 2.2.4 Failure Rate of Electronic Components; 2.2.5 Reliability of One-Item Structures
2.2.6 Reliability of Series Parallel Structures with Independent Elements2.2.6.1 Systems without Redundancy (series models); 2.2.6.2 Concept of Redundancy; 2.2.6.3 Parallel Models; 2.2.6.4 Series Parallel Structures with Independent Elements; 2.2.6.5 Majority Redundancy; 2.2.7 Part Count Method; 2.3 Reliability of Systems with Complex Structure; 2.3.1 Key Item Method; 2.3.1.1 Bridge Structure; 2.3.1.2 Reliability Block Diagram in Which at Least One Element Appears More than Once; 2.3.2 Successful Path Method; 2.3.3 State Space Method; 2.3.4 Boolean Function Method
2.3.5 Parallel Models with Const. Failure Rates & Load Sharing2.3.6 Elements with more than one Failure Mechanism or one Failure Mode; 2.3.7 Basic Considerations on Fault Tolerant Structures; 2.4 Reliability Allocation and Optimization; 2.5 Mechanical Reliability, Drift Failures; 2.6 Failure Modes Analyses; 2.7 Reliability Aspects in Design Reviews; 3 Qualification Tests for Components and Assemblies; 3.1 Basic Selection Criteria for Electronic Components; 3.1.1 Environment; 3.1.2 Performance Parameters; 3.1.3 Technology; 3.1.4 Manufacturing Quality
3.1.5 Long-Term Behavior of Performance Parameters3.1.6 Reliability; 3.2 Qualification Tests for Complex Electronic Components; 3.2.1 Electrical Test of Complex ICs; 3.2.2 Characterization of Complex ICs; 3.2.3 Environmental and Special Tests of Complex ICs; 3.2.4 Reliability Tests; 3.3 Failure Modes, Failure Mechanisms, and Failure Analysis of Electronic Components; 3.3.1 Failure Modes of Electronic Components; 3.3.2 Failure Mechanisms of Electronic Components; 3.3.3 Failure Analysis of Electronic Components; 3.3.4 Present VLSI Production-Related Reliability Problems
Abstract: This book shows how to build in, evaluate, and demonstrate reliability and availability of components, equipment, systems. It features checklists for design reviews and more than 100 practice oriented examples.
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Holdings
Item type Current library Collection Call number Status Date due Barcode Item holds
LIBRO-E NO PRÉSTAMO LIBRO-E NO PRÉSTAMO Madrid Digital Acceso Electrónico (UEM) Ciencias e Ingeniería TA169 .B576 2017 EB (Browse shelf(Opens below)) Acceso electrónico eBook.20023653
Total holds: 0

SpringerLink Springer Engineering eBooks 2017 English+International

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Preface to the 8 th Edition; Contents; 1 Basic Concepts, Quality & Reliability (RAMS) Assurance of Complex Equipment & Systems; 1.1 Introduction; 1.2 Basic Concepts; 1.2.1 Reliability; 1.2.2 Failure; 1.2.3 Failure Rate, MTTF, MTBF; 1.2.4 Maintenance, Maintainability; 1.2.5 Logistic Support; 1.2.6 Availability; 1.2.7 Safety, Risk, Risk Acceptance; 1.2.8 Quality; 1.2.9 Cost and System Effectiveness; 1.2.10 Product Liability; 1.2.11 Historical Development; 1.3 Basic Tasks & Rules for Quality and Reliability (RAMS) Assurance of Complex Equip. & Systems

1.3.1 Quality and Reliability (RAMS) Assurance Tasks1.3.2 Basic Quality and Reliability (RAMS) Assurance Rules; 1.3.3 Elements of a Quality Assurance System; 1.3.4 Motivation and Training; 2 Reliability Analysis During the Design Phase; 2.1 Introduction; 2.2 Predicted Reliability of Equipment and Systems with Simple Structure; 2.2.1 Required Function; 2.2.2 Reliability Block Diagram; 2.2.3 Operating Conditions at Component Level, Stress Factors; 2.2.4 Failure Rate of Electronic Components; 2.2.5 Reliability of One-Item Structures

2.2.6 Reliability of Series Parallel Structures with Independent Elements2.2.6.1 Systems without Redundancy (series models); 2.2.6.2 Concept of Redundancy; 2.2.6.3 Parallel Models; 2.2.6.4 Series Parallel Structures with Independent Elements; 2.2.6.5 Majority Redundancy; 2.2.7 Part Count Method; 2.3 Reliability of Systems with Complex Structure; 2.3.1 Key Item Method; 2.3.1.1 Bridge Structure; 2.3.1.2 Reliability Block Diagram in Which at Least One Element Appears More than Once; 2.3.2 Successful Path Method; 2.3.3 State Space Method; 2.3.4 Boolean Function Method

2.3.5 Parallel Models with Const. Failure Rates & Load Sharing2.3.6 Elements with more than one Failure Mechanism or one Failure Mode; 2.3.7 Basic Considerations on Fault Tolerant Structures; 2.4 Reliability Allocation and Optimization; 2.5 Mechanical Reliability, Drift Failures; 2.6 Failure Modes Analyses; 2.7 Reliability Aspects in Design Reviews; 3 Qualification Tests for Components and Assemblies; 3.1 Basic Selection Criteria for Electronic Components; 3.1.1 Environment; 3.1.2 Performance Parameters; 3.1.3 Technology; 3.1.4 Manufacturing Quality

3.1.5 Long-Term Behavior of Performance Parameters3.1.6 Reliability; 3.2 Qualification Tests for Complex Electronic Components; 3.2.1 Electrical Test of Complex ICs; 3.2.2 Characterization of Complex ICs; 3.2.3 Environmental and Special Tests of Complex ICs; 3.2.4 Reliability Tests; 3.3 Failure Modes, Failure Mechanisms, and Failure Analysis of Electronic Components; 3.3.1 Failure Modes of Electronic Components; 3.3.2 Failure Mechanisms of Electronic Components; 3.3.3 Failure Analysis of Electronic Components; 3.3.4 Present VLSI Production-Related Reliability Problems

This book shows how to build in, evaluate, and demonstrate reliability and availability of components, equipment, systems. It features checklists for design reviews and more than 100 practice oriented examples.

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